The DOI matches its Crossref record; 16 of the 16 references it cites were found in a registry or an index.
Short cantilevers for atomic force microscopy
Abstract
We have designed and tested a family of silicon nitride cantilevers ranging in length from 23 to 203 μm. For each, we measured the frequency spectrum of thermal motion in air and water. Spring constants derived from thermal motion data agreed fairly well with the added mass method; these and the resonant frequencies showed the expected increase with decreasing cantilever length. The effective cantilever density (calculated from the resonant frequencies) was 5.0 g/cm3, substantially affected by the mass of the reflective gold coating. In water, resonant frequencies were 2 to 5 times lower and damping was 9 to 24 times higher than in air. Thermal motion at the resonant frequency, a measure of noise in tapping mode atomic force microscopy, decreased about two orders of magnitude from the longest to the shortest cantilever. The advantages of the high resonant frequency and low noise of a short (30 μm) cantilever were demonstrated in tapping mode imaging of a protein sample in buffer. Low-noise images were taken with feedback at a rate of about 0.5 frames/s. Given proper setpoint adjustment, the sample was not damaged, despite this cantilever’s high spring constant of 1.3 N/m. Without feedback, images were taken at 1.5 frames/s.
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Cites
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Calibration of atomic-force microscope tips
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Self-citationCalculation of thermal noise in atomic force microscopy
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Method for the calibration of atomic force microscope cantilevers
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Tapping mode atomic force microscopy in liquids
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Self-citationMicrofabrication of cantilever styli for the atomic force microscope
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Cited by
Calibration of rectangular atomic force microscope cantilevers
Sader, J. E., Chon, J. W. M., & Mulvaney, P. (1999) · Review of Scientific Instruments · doi:10.1063/1.1150021 · Cited by 2,145
Comparison of calibration methods for atomic-force microscopy cantilevers
Burnham, N. A., Chen, X., Hodges, C. S., Matei, G. A., Thoreson, E. J., Roberts, C. J., Davies, M. C., & Tendler, S. J. B. (2003) · Nanotechnology · doi:10.1088/0957-4484/14/1/301 · Cited by 458
AFM: a versatile tool in biophysics
Alessandrini, A., & Facci, P. (2005) · Measurement Science and Technology · doi:10.1088/0957-0233/16/6/r01 · Cited by 384
Control of myocyte remodeling in vitro with engineered substrates
Geisse, N. A., Sheehy, S. P., & Parker, K. K. (2009) · In Vitro Cellular & Developmental Biology - Animal · doi:10.1007/s11626-009-9182-9 · Cited by 82
Metadata
- Authors
- Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., & Elings, V.
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 1996-10-01
- Volume
- 67
- Issue
- 10
- Pages
- 3583-3590
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2040671013
- Cited by
- 494
- References
- 16
- FWCI
- 9.60
- Type
- journal article
- Language
- en
- Open access
- closed
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- Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., & Elings, V. (1996). Short cantilevers for atomic force microscopy. Review of Scientific Instruments. https://doi.org/10.1063/1.1147177
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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