The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.
A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy
Abstract
The spring constant of microfabricated cantilevers used in scanning force microscopy (SFM) can be determined by measuring their resonant frequencies before and after adding small end masses. These masses adhere naturally and can be easily removed before using the cantilever for SFM, making the method nondestructive. The observed variability in spring constant—almost an order of magnitude for a single type of cantilever—necessitates calibration of individual cantilevers in work where precise knowledge of forces is required. Measurements also revealed that the spring constant scales with the cube of the unloaded resonant frequency, providing a simple way to estimate the spring constant for less precise work.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Binnig, G., Quate, C. F., & Gerber, C. (1986) · Physical Review Letters · doi:10.1103/physrevlett.56.930 · Cited by 14,762
Direct measurement of colloidal forces using an atomic force microscope
Ducker, W. A., Senden, T. J., & Pashley, R. M. (1991) · Nature · doi:10.1038/353239a0 · Cited by 2,075
Israelachvili, J. N., & Adams, G. E. (1978) · Journal of the Chemical Society, Faraday Transactions 1: Physical Chemistry in Condensed Phases · doi:10.1039/f19787400975 · Cited by 1,812
Novel optical approach to atomic force microscopy
Meyer, G., & Amer, N. M. (1988) · Applied Physics Letters · doi:10.1063/1.100061 · Cited by 1,290
Measurement of forces in liquids using a force microscope
Ducker, W. A., Senden, T. J., & Pashley, R. M. (1992) · Langmuir · doi:10.1021/la00043a024 · Cited by 1,080
Harris, C. M., Crede, C. E., & Trent, H. M. (1962) · Physics Today · doi:10.1063/1.3058391 · Cited by 1,023
Microfabrication of cantilever styli for the atomic force microscope
Albrecht, T. R., Akamine, S., Carver, T. E., & Quate, C. F. (1990) · Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films · doi:10.1116/1.576520 · Cited by 747
Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces
Sarid, D., Coratger, R., Ajustron, F., & Beauvillain, J. (1991) · Microscopy Microanalysis Microstructures · doi:10.1051/mmm:0199100206064900 · Cited by 563
Atomic Resolution with Atomic Force Microscope
Binnig, G., Gerber, C., Stoll, E., Albrecht, T. R., & Quate, C. F. (1987) · Europhysics Letters (EPL) · doi:10.1209/0295-5075/3/12/006 · Cited by 559
Weisenhorn, A. L., Maivald, P., Butt, H.-J., & Hansma, P. K. (1992) · Physical Review B · doi:10.1103/physrevb.45.11226 · Cited by 485
Self-citation
Cited by
Calibration of rectangular atomic force microscope cantilevers
Sader, J. E., Chon, J. W. M., & Mulvaney, P. (1999) · Review of Scientific Instruments · doi:10.1063/1.1150021 · Cited by 2,145
Micromechanical cantilever-based biosensors
Raiteri, R., Grattarola, M., Butt, H.-J., & Skládal, P. (2001) · Sensors and Actuators B: Chemical · doi:10.1016/s0925-4005(01)00856-5 · Cited by 734
Short cantilevers for atomic force microscopy
Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurley, G., & Elings, V. (1996) · Review of Scientific Instruments · doi:10.1063/1.1147177 · Cited by 494
Self-citationNanoscale Mapping of the Elasticity of Microbial Cells by Atomic Force Microscopy
Touhami, A., Nysten, B., & Dufrêne, Y. F. (2003) · Langmuir · doi:10.1021/la034136x · Cited by 466
Comparison of calibration methods for atomic-force microscopy cantilevers
Burnham, N. A., Chen, X., Hodges, C. S., Matei, G. A., Thoreson, E. J., Roberts, C. J., Davies, M. C., & Tendler, S. J. B. (2003) · Nanotechnology · doi:10.1088/0957-4484/14/1/301 · Cited by 458
Metadata
- Authors
- Cleveland, J. P., Manne, S., Bocek, D., & Hansma, P. K.
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 1993-02-01
- Volume
- 64
- Issue
- 2
- Pages
- 403-405
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2053787721
- Cited by
- 1,642
- References
- 10
- FWCI
- 18.41
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. https://app.cochat.ai/papers/10.1063/1.1144209
- The paper
- Cleveland, J. P., Manne, S., Bocek, D., & Hansma, P. K. (1993). A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Review of Scientific Instruments. https://doi.org/10.1063/1.1144209
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
