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Cited by 632

The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.

Forces in atomic force microscopy in air and water

Weisenhorn, A. L., Hansma, P. K., Albrecht, T. R., Quate, C. F.·1989·Applied Physics Letters

Abstract

A new atomic force microscope, which combines a microfabricated cantilever with an optical lever detection system, now makes it possible to measure the absolute force applied by a tip on a surface. This absolute force has been measured as a function of distance (=position of the surface) in air and water over a range of 600 nm. In the absolute force versus distance curves there are two transitions from touching the surface to a total release in air caused by van der Waals interaction and surface tension. One transition is due to lifting off the surface; the other is due to lifting out of an adsorbed layer on the surface. In water there is just one transition due to lifting off the surface. There is also a transition in air and water when the totally released tip is pulled down to touch the surface as the surface and tip are brought together. Based on the force versus distance curves, we propose a procedure to set the lowest possible imaging force. It can now be as low as 10−9 N or less in water and 10−7 N in air.

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Metadata

Authors
Weisenhorn, A. L., Hansma, P. K., Albrecht, T. R., & Quate, C. F.
Venue
Applied Physics Letters
Published
1989-06-26
Volume
54
Issue
26
Pages
2651-2653
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2033841089
Cited by
632
References
10
FWCI
14.58
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Forces in atomic force microscopy in air and water. https://app.cochat.ai/papers/10.1063/1.101024
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Weisenhorn, A. L., Hansma, P. K., Albrecht, T. R., & Quate, C. F. (1989). Forces in atomic force microscopy in air and water. Applied Physics Letters. https://doi.org/10.1063/1.101024

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