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Atomic force microscope–force mapping and profiling on a sub 100-Å scale
Abstract
A modified version of the atomic force microscope is introduced that enables a precise measurement of the force between a tip and a sample over a tip-sample distance range of 30–150 Å. As an application, the force signal is used to maintain the tip-sample spacing constant, so that profiling can be achieved with a spatial resolution of 50 Å. A second scheme allows the simultaneous measurement of force and surface profile; this scheme has been used to obtain material-dependent information from surfaces of electronic materials.
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Citations
Cited by
Calculation of thermal noise in atomic force microscopy
Butt, H. J., & Jaschke, M. (1995) · Nanotechnology · doi:10.1088/0957-4484/6/1/001 · Cited by 1,589
Phase imaging and stiffness in tapping-mode atomic force microscopy
Magonov, S. N., Elings, V., & Whangbo, M.-H. (1997) · Surface Science · doi:10.1016/s0039-6028(96)01591-9 · Cited by 1,020
Forces in atomic force microscopy in air and water
Weisenhorn, A. L., Hansma, P. K., Albrecht, T. R., & Quate, C. F. (1989) · Applied Physics Letters · doi:10.1063/1.101024 · Cited by 632
Jalili, N., & Laxminarayana, K. (2004) · Mechatronics · doi:10.1016/j.mechatronics.2004.04.005 · Cited by 610
Preparation of DNA and nucleoprotein samples for AFM imaging
Lyubchenko, Y. L. (2011) · Micron · doi:10.1016/j.micron.2010.08.011 · Cited by 93
Metadata
- Authors
- Martin, Y., Williams, C. C., & Wickramasinghe, H. K.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1987-05-15
- Volume
- 61
- Issue
- 10
- Pages
- 4723-4729
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2074398939
- Cited by
- 1,428
- References
- 0
- FWCI
- 20.14
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Atomic force microscope–force mapping and profiling on a sub 100-Å scale. https://app.cochat.ai/papers/10.1063/1.338807
- The paper
- Martin, Y., Williams, C. C., & Wickramasinghe, H. K. (1987). Atomic force microscope–force mapping and profiling on a sub 100-Å scale. Journal of Applied Physics. https://doi.org/10.1063/1.338807
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
