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The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis
Abstract
The x-ray line profiles of an ultrafine grained copper crystal, produced by equal-channel angular pressing, were measured by a special high resolution diffractometer with negligible instrumental line broadening. The analysis of the line breadths and the Fourier coefficients have shown that taking into account the contrast caused by dislocations on line profiles gives new scaling factors in the Williamson–Hall plot and in the Warren–Averbach analysis, respectively. When strain is caused by dislocations the new procedure proposed here enables a straightforward determination of particle size and strain, the latter in terms of the dislocation density.
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Citations
Cited by
Khodakov, A. Y., Chu, W., & Fongarland, P. (2007) · Chemical Reviews · doi:10.1021/cr050972v · Cited by 2,377
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Weidenthaler, C. (2011) · Nanoscale · doi:10.1039/c0nr00561d · Cited by 256
Satoh, K., Sato, S., Yamanaka, K., Suzuki, S., Chiba, A., & Wagatsuma, K. (2016) · High Temperature Materials and Processes · doi:10.1515/htmp-2015-0039 · Cited by 5
Metadata
- Authors
- Ungár, T., & Borbély, A.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 1996-11-18
- Volume
- 69
- Issue
- 21
- Pages
- 3173-3175
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W1969987170
- Cited by
- 1,378
- References
- 0
- FWCI
- 4.05
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis. https://app.cochat.ai/papers/10.1063/1.117951
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- Ungár, T., & Borbély, A. (1996). The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis. Applied Physics Letters. https://doi.org/10.1063/1.117951
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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