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Ferroelectricity in thin perovskite films

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Tybell, T., Ahn, C. H., Triscone, J.-M.·1999·Applied Physics Letters

Abstract

We report on the investigation of ferroelectricity in thin tetragonal single-crystalline perovskite films of Pb(Zr0.2Ti0.8)O3 grown by off-axis rf magnetron sputtering. The local ferroelectric properties of atomically smooth films, with thicknesses ranging from a few unit cells to 800 Å, were measured using a combination of electric force microscopy and piezoelectric microscopy. The time dependence of the measured signals reveals a stable ferroelectric polarization in films down to thicknesses of 40 Å.

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Metadata

Authors
Tybell, T., Ahn, C. H., & Triscone, J.-M.
Venue
Applied Physics Letters
Published
1999-08-09
Volume
75
Issue
6
Pages
856-858
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2064193542
Cited by
461
References
0
FWCI
11.44
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Ferroelectricity in thin perovskite films. https://app.cochat.ai/papers/10.1063/1.124536
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Tybell, T., Ahn, C. H., & Triscone, J.-M. (1999). Ferroelectricity in thin perovskite films. Applied Physics Letters. https://doi.org/10.1063/1.124536

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