The DOI matches its Crossref record.
MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS
Abstract
We report theory and experiment on modes of propagating light waves in deposited semiconductor films. The modes are excited by a novel prism-film coupler which is also used for the measurement of their phase velocities. Up to 50% of the incident laser energy has been fed into a single mode of propagation. The positions and linewidths of the modes, the wave intensity inside the film, and a dramatic view of the mode spectrum displayed by the scattered light are discussed in detail.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Measurement of Thin Film Parameters with a Prism Coupler
Ulrich, R., & Torge, R. (1973) · Applied Optics · doi:10.1364/ao.12.002901 · Cited by 964
Self-citationIntegrated Optics: An Introduction
Miller, S. E. (1969) · Bell System Technical Journal · doi:10.1002/j.1538-7305.1969.tb01165.x · Cited by 601
Manipulation of photons at the surface of three-dimensional photonic crystals
Ishizaki, K., & Noda, S. (2009) · Nature · doi:10.1038/nature08190 · Cited by 192
Metadata
- Authors
- Tien, P. K., Ulrich, R., & Martin, R. J.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 1969-05-01
- Volume
- 14
- Issue
- 9
- Pages
- 291-294
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2015798832
- Cited by
- 769
- References
- 0
- FWCI
- 56.37
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS. https://app.cochat.ai/papers/10.1063/1.1652820
- The paper
- Tien, P. K., Ulrich, R., & Martin, R. J. (1969). MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS. Applied Physics Letters. https://doi.org/10.1063/1.1652820
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.