The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.
Measurement of Thin Film Parameters with a Prism Coupler
Abstract
The prism coupler, known from experiments on integrated optics, can be used to determine the refractive index and the thickness of a light-guiding thin film. Both parameters are obtained simultaneously and with good accuracy by measuring the coupling angles at the prism and fitting them by a theoretical dispersion curve. The fundamentals and limitations. of this method are discussed, its practical use, and mathematical procedures for the evaluation.
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Citations
Cites
Light Waves in Thin Films and Integrated Optics
Tien, P. K. (1971) · Applied Optics · doi:10.1364/ao.10.002395 · Cited by 1,087
MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS
Tien, P. K., Ulrich, R., & Martin, R. J. (1969) · Applied Physics Letters · doi:10.1063/1.1652820 · Cited by 769
Self-citationTheory of the Prism–Film Coupler by Plane-Wave Analysis
Ulrich, R. (1970) · Journal of the Optical Society of America · doi:10.1364/josa.60.001337 · Cited by 356
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Epitaxial LiNbO3 Thin Films Grown by Pulsed Laser Deposition for Optical Waveguides
Balestrino, G., Martellucci, S., Medaglia, P. G., Paoletti, A., Petrocelli, G., Tebano, A., Tucciarone, A., Gelli, F., Giorgetti, E., Sottini, S., et al. (2001) · Applied Physics Letters · doi:10.1063/1.1350903 · Cited by 27
Single-crystal lithium niobate films by crystal ion slicing
Levy, M., & Radojevic, A. M. (2004) · Springer series in materials science · doi:10.1007/978-3-662-10827-7_12 · Cited by 7
Metadata
- Authors
- Ulrich, R., & Torge, R.
- Venue
- Applied Optics
- Publisher
- Optica Publishing Group
- Published
- 1973-12-01
- Volume
- 12
- Issue
- 12
- Pages
- 2901
- ISSN
- 0003-6935 (ISSN-L)
- 1539-4522
- OpenAlex
- W2096803844
- Cited by
- 964
- References
- 3
- FWCI
- 5.71
- Type
- journal article
- Language
- en
- Open access
- closed
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