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The Theoretical Resolution Limit of the Electron Microscope
Abstract
The resolving power of the electron microscope and the contrast in the image are calculated for different conditions of focusing, illumination and aperture. These conditions can change the limit of resolution by a factor of about 3. The contrast in the image of an atom is appreciably increased by defocusing and spherical aberration. Nevertheless, the contrast improves when the numerical value of the aberration constant is diminished. The effect of different methods of spherical correction is discussed briefly.
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Cited by
Cryo-electron microscopy of vitrified specimens
Dubochet, J., Adrian, M., Chang, J.-J., Homo, J.-C., Lepault, J., McDowall, A. W., & Schultz, P. (1988) · Quarterly Reviews of Biophysics · doi:10.1017/s0033583500004297 · Cited by 2,389
Transmission Electron Microscopy of Shape-Controlled Nanocrystals and Their Assemblies
Wang, Z. L. (2000) · The Journal of Physical Chemistry B · doi:10.1021/jp993593c · Cited by 2,137
Z-contrast stem for materials science
Pennycook, S. J. (1989) · Ultramicroscopy · doi:10.1016/0304-3991(89)90173-3 · Cited by 580
Direct transformation of graphene to fullerene
Chuvilin, A., Kaiser, U., Bichoutskaia, E., Besley, N. A., & Khlobystov, A. N. (2010) · Nature Chemistry · doi:10.1038/nchem.644 · Cited by 417
Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope
Pennycook, S. J., Rafferty, B., & Nellist, P. D. (2000) · Microscopy and Microanalysis · doi:10.1017/s1431927602000594 · Cited by 148
Metadata
- Authors
- Scherzer, O.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1949-01-01
- Volume
- 20
- Issue
- 1
- Pages
- 20-29
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2048380342
- Cited by
- 915
- References
- 0
- FWCI
- 2.79
- Type
- journal article
- Language
- en
- Open access
- closed
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