Thermal Conductivity of Pure and Impure Silicon, Silicon Carbide, and Diamond
Abstract
Thermal conductivity measurements on high-purity SiC and impure Si and SiC have been made over the temperature range from 3° to 300°K. These results show that the thermal conductivity K, of the highest purity SiC is intermediate between those of pure Si and pure diamond, and at 300°K is greater than that of copper. The heat transport in SiC is produced by phonons and these are scattered by other phonons, isotopes, and the crystal boundaries in the pure material. In impure SiC the phonons are also scattered by the electrically active impurities Al and N. These impurities reduce the K of SiC in much the same way that B and P impurities do in Si. The N impurities in natural diamonds also reduce their K below that of ideally pure diamond, but the effect is rather different since N is not electrically active.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
The bulk thermal conductivity of SiC (4H and 6H) at T = 300 K is 490 W/mK.
“The bulk thermal conductivities of GaAs, GaN, AlN, and SiC (4H and 6H) at T = 300 K are 501213, 2301415, 28516, and 490 Wm−1K−11718, respectively.”
From Universal phonon mean free path spectra in crystalline semiconductors at high temperature (2013) · cites this paper as [18]
Cited by
Sorted by citations
Regner, K. T., Sellan, D. P., Su, Z., Amon, C. H., McGaughey, A. J. H., & Malen, J. A. (2013) · Nature Communications · doi:10.1038/ncomms2630 · Cited by 646 · see citing works
Zheng, Q., Li, C., Rai, A., Leach, J. H., Broido, D. A., & Cahill, D. G. (2019) · Physical Review Materials · doi:10.1103/physrevmaterials.3.014601 · Cited by 177 · see citing works
Universal phonon mean free path spectra in crystalline semiconductors at high temperature
Freedman, J. P., Leach, J. H., Preble, E. A., Sitar, Z., Davis, R. F., & Malen, J. A. (2013) · Scientific Reports · doi:10.1038/srep02963 · Cited by 171 · see citing works
Thermal conductivity and electrical properties of 6 <i>H</i> silicon carbide
Burgemeister, E. A., von Muench, W., & Pettenpaul, E. (1979) · Journal of Applied Physics · doi:10.1063/1.326720 · Cited by 168 · see citing works
- Authors
- Slack, G. A.
- Affiliations
- General Electric (United States) (US)
- Corresponding author
- Slack, Glen A.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1964-12-01
- Volume
- 35
- Issue
- 12
- Pages
- 3460-3466
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2018825318
- Cited by
- 695
- References
- 0
- Citations by year
- 2026: 34 · 2025: 39 · 2024: 38 · 2023: 34 · 2022: 31 · 2021: 29 · 2020: 33 · 2019: 44 · 2018: 34 · 2017: 24 · 2016: 23 · 2015: 23 · 2014: 25 · 2013: 25 · 2012: 16
- FWCI
- 4.08
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Applied Physics (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
- Physical Sciences › Materials Science › Materials Chemistry › Diamond and Carbon-based Materials Research
- Keywords
- thermal conductivity, silicon carbide, silicon, diamond, phonon scattering, phonon-phonon scattering, isotope scattering, grain boundary scattering, impurity scattering, aluminum impurity, nitrogen impurities, low-temperature thermal transport
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review