Cited by 695Thermal properties of materialsSilicon Carbide Semiconductor TechnologiesDiamond and Carbon-based Materials Research

Thermal Conductivity of Pure and Impure Silicon, Silicon Carbide, and Diamond

Slack, Glen A.·1964·Journal of Applied Physics

Abstract

Thermal conductivity measurements on high-purity SiC and impure Si and SiC have been made over the temperature range from 3° to 300°K. These results show that the thermal conductivity K, of the highest purity SiC is intermediate between those of pure Si and pure diamond, and at 300°K is greater than that of copper. The heat transport in SiC is produced by phonons and these are scattered by other phonons, isotopes, and the crystal boundaries in the pure material. In impure SiC the phonons are also scattered by the electrically active impurities Al and N. These impurities reduce the K of SiC in much the same way that B and P impurities do in Si. The N impurities in natural diamonds also reduce their K below that of ideally pure diamond, but the effect is rather different since N is not electrically active.

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Crossref · 10.1063/1.1713251

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Authors
Slack, G. A.
Affiliations
General Electric (United States) (US)
Corresponding author
Slack, Glen A.
Venue
Journal of Applied Physics
Published
1964-12-01
Volume
35
Issue
12
Pages
3460-3466
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2018825318
Cited by
695
References
0
Citations by year
2026: 34 · 2025: 39 · 2024: 38 · 2023: 34 · 2022: 31 · 2021: 29 · 2020: 33 · 2019: 44 · 2018: 34 · 2017: 24 · 2016: 23 · 2015: 23 · 2014: 25 · 2013: 25 · 2012: 16
FWCI
4.08
Type
journal article
Language
en
Open access
closed
Locations
Journal of Applied Physics (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Thermal properties of materials
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Materials Science › Materials Chemistry › Diamond and Carbon-based Materials Research
Keywords
thermal conductivity, silicon carbide, silicon, diamond, phonon scattering, phonon-phonon scattering, isotope scattering, grain boundary scattering, impurity scattering, aluminum impurity, nitrogen impurities, low-temperature thermal transport

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