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Direct measurement of thermal conductivity of aluminum nanowires
Abstract
A nanofabricated electrothermal test structure is reported for directly measuring the thermal conductivity of aluminum nanowires near room temperature. Interdigitated nanowires perturb an otherwise symmetric heater-sensor structure analogous to an electrical bridge circuit. Nanowires studied are 100 nm thick with 75, 100, and 150 nm widths. Finite element simulation accounts for complex device geometry. Thermal conductivity and electrical resistivity vary significantly with nanowire dimensions. Electron transport equation models which adequately describe the resistivity data consistently underestimate the thermal conductivity. Incorporating a phonon contribution of ∼21 W/m K to the total thermal conductivity is found to accurately describe the measured values.
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Resistance thermometers (RTDs) and infrared thermography are often employed for temperature sensing when testing small samples by using the absolute technique.
“Resistance thermometers (i.e.RTDs) [24,25] and infrared (IR) thermography [26] are often employed for temperature sensing when testing small samples (in micron scale or even smaller) by using absolute technique.”
From Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials (2016) · cites this paper as [25]
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Cited by
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Zhao, D., Qian, X., Gu, X., Jajja, S. A., & Yang, R. (2016) · Journal of Electronic Packaging · doi:10.1115/1.4034605 · Cited by 559
Metadata
- Authors
- Stojanovic, N., Berg, J. M., Maithripala, D. H. S., & Holtz, M.
- Affiliations
- Texas Tech University 1 Department of Mechanical Engineering, , Lubbock, Texas 79409, USA
- University of Peradeniya, Peradeniya, Kandy 20400 3 Department of Mechanical Engineering, , Sri Lanka
- Texas Tech University 2 Nano Tech Center, , Lubbock, Texas 79409, USA
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2009-08-31
- Volume
- 95
- Issue
- 9
- ISSN
- 0003-6951
- 1077-3118
- Cited by
- 38
- References
- 0
- Language
- en
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