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Electric field effect on the thermal emission of traps in semiconductor junctions

Vincent, G., Chantre, A., Bois, D.·1979·Journal of Applied Physics

Abstract

Electric field effects on the thermal emission of traps in a diode have been studied. Calculations were performed and compared with experimental data on deep centers in GaAs. The results are consistent with a thermal equivalent of the optical Franz-Keldysh effect.

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Metadata

Authors
Vincent, G., Chantre, A., & Bois, D.
Venue
Journal of Applied Physics
Published
1979-08-01
Volume
50
Issue
8
Pages
5484-5487
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2049882944
Cited by
535
References
0
FWCI
3.30
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Electric field effect on the thermal emission of traps in semiconductor junctions. https://app.cochat.ai/papers/10.1063/1.326601
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Vincent, G., Chantre, A., & Bois, D. (1979). Electric field effect on the thermal emission of traps in semiconductor junctions. Journal of Applied Physics. https://doi.org/10.1063/1.326601

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.