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Cited by 196

The DOI matches its Crossref record; 6 of the 6 references it cites were found in a registry or an index.

Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators

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Shahil, K. M. F., Hossain, M. Z., Teweldebrhan, D., Balandin, A. A.·2010·Applied Physics Letters

Abstract

The authors report results of micro-Raman spectroscopy investigation of mechanically exfoliated single-crystal bismuth telluride films with thickness ranging from a few-nanometers to bulk limit. It is found that the optical phonon mode A1u, which is not-Raman active in bulk Bi2Te3 crystals, appears in the atomically-thin films due to crystal-symmetry breaking. The intensity ratios of the out-of-plane A1u and A1g modes to the in-plane Eg mode grow with decreasing film thickness. The evolution of Raman signatures with the film thickness can be used for identification of Bi2Te3 crystals with the thickness of few-quintuple layers important for topological insulator and thermoelectric applications.

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Metadata

Authors
Shahil, K. M. F., Hossain, M. Z., Teweldebrhan, D., & Balandin, A. A.
Venue
Applied Physics Letters
Published
2010-04-12
Volume
96
Issue
15
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2081085780
Cited by
196
References
6
FWCI
10.51
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators. https://app.cochat.ai/papers/10.1063/1.3396190
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Shahil, K. M. F., Hossain, M. Z., Teweldebrhan, D., & Balandin, A. A. (2010). Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators. Applied Physics Letters. https://doi.org/10.1063/1.3396190

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.