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Cited by 429

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Optoelectronic measurement of semiconductor surfaces and interfaces with femtosecond optics

Zhang, X.-C., Auston, D. H.·1992·Journal of Applied Physics

Abstract

The basic concepts and preliminary applications of optically induced electromagnetic radiation from semiconductor surfaces and interfaces by using femtosecond optics are discussed. This submillimeter-wave radiation provides a novel optoelectronic technique to study semiconductor electronic surface and interface properties with a contactless approach. The amplitude and phase of the electromagnetic radiation from the semiconductor surfaces depend on carrier mobility, impurity doping concentration, and strength and polarity of the static internal field. A large selection of bulk, epitaxial layer and superlattice samples from III-V, II-VI and group-IV semiconductors has been tested. The orientation and strength of the static built-in fields of a wide range of semiconductor surfaces, such as surface depletion, metal/semiconductor Schottky, p-n junction and strain-induced piezoelectric fields, can be determined and estimated.

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Metadata

Authors
Zhang, X.-C., & Auston, D. H.
Venue
Journal of Applied Physics
Published
1992-01-01
Volume
71
Issue
1
Pages
326-338
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W2072821301
Cited by
429
References
1
FWCI
13.06
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Optoelectronic measurement of semiconductor surfaces and interfaces with femtosecond optics. https://app.cochat.ai/papers/10.1063/1.350710
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Zhang, X.-C., & Auston, D. H. (1992). Optoelectronic measurement of semiconductor surfaces and interfaces with femtosecond optics. Journal of Applied Physics. https://doi.org/10.1063/1.350710

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.