Dead Layer Thickness Estimation at the Ferroelectric Film-Metal Interface in PZT
Open accessAbstract
Different models for estimation of the dead layer thickness at the ferroelectric film-metal interface are discussed, including the small-signal capacitance model and two methods based on dielectric hysteresis analysis—one based on slopes of the hysteresis loops at the coercive field and the other method based on comparison of dielectric hysteresis portraits. It is shown that the latter technique yields more reliable data as it excludes the effect of leakage and relaxation loss. Conductivity may have a pronounced effect on the validity of dead-layer thickness data. This work relates peripherally to negative capacitance in ferroelectric films and to lozenge-shaped hysteresis curves.
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Another possible reason is different dead layer thickness at interfaces.
“Another possible reason is the different dead layer thickness at the interfaces [63].”
From Control of Columnar Grain Microstructure in CSD LaNiO3 Films (2023) · cites this paper as [63]
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Research works printed but not linked: 23
- B. Chen, H. Yang, L. Zhao, J. Miao, B. Xu, X. G. Qiu, B. R. Zhao, X. Y. Qi, and X. F. Duan, "Thickness and dielectric constant of dead layer in Pt/ (Ba 0.7 Sr 0.3 )TiO 3 /YBa 2 Cu 3 O 7-x capacitor," Appl. Phys. Lett. 84, 583-585 (2004). · DOI
- A. Q. Jiang, C. Wang, B. L. Cheng, and Z. H. Chen, "Experimental determina- tion of interfacial-layer thickness from polarization-voltage hysteresis loops in Pb(Zr 0.4 Ti 0.6 )O 3 thin films," Appl. Phys. Lett. 86, 202904 (2005). · DOI
- B. T. Lee and C. S. Hwang, "Influences of interfacial intrinsic low-dielectric layers on the dielectric properties of sputtered (Ba,Sr)TiO 3 thin films," Appl. Phys. Lett. 77(1), 124-126 (2000). · DOI
- H. Yang, N. A. Suvorova, M. Jain, B. S. Kang, Y. Li, M. E. Hawley, P. C. Dowden, R. F. DePaula, Q. X. Jiaa, and C. J. Lu, "Effective thickness and dielec- tric constant of interfacial layers of Pt/Bi 3.15 Nd 0.85 Ti 3 O 12 /SrRuO 3 capacitors," Appl. Phys. Lett. 90, 232909 (2007). · DOI
- P. K. Larsen, G. J. M. Dormans, D. J. Taylor, and P. J. van Veldhoven, "Ferroelectric properties and fatigue of PbZr 0.51 Ti 0.49 O 3 thin films of varying thickness: Blocking layer model," J. Appl. Phys. 76, 2405-2413 (1994). · DOI
- J. J. Lee, C. L. Thio, and S. B. Desu, "Electrode contacts on ferroelectric Pb(Zr x Ti 1-x )O 3 and SrBi 2 Ta 2 O 9 thin films and their influence on fatigue prop- erties," J. Appl. Phys. 78, 5073 (1995). · DOI
- J. Kim, J. Par, K. Nam, and G. Park, "Ferroelectric (Ba,Sr)TiO 3 thin films on Pt/Ti/SiO 2 /Si substrates by the sol-gel process and evaluation of the intrinsic dead layers," J. Korean Phys. Soc. 47, S349 (2005). · DOI
- Y. V. Podgorny, D. S. Seregin, A. S. Sigov, and K. A. Vorotilov, "Effect of sol- gel PZT film thickness on the hysteresis properties," Ferroelectrics 439(1), 74-79 (2012). · DOI
- A. K. Tagantsev, M. Landivar, E. Colla, and N. Setter, "Identification of passive layer in ferroelectric thin films from their switching parameters," J. Appl. Phys. 78, 2623-2630 (1995). · DOI
- U. B€ ottger and R. Waser, "Interaction between depolarization effects, interface layer, and fatigue behavior in PZT thin film capacitors," J. Appl. Phys. 122, 024105 (2017). · DOI
- M. Dawber, K. M. Rabe, and J. F. Scott, "Physics of thin-film ferroelectric oxides," Rev. Mod. Phys. 77, 1083-1130 (2005). · DOI
- Yu. Podgorny, K. Vorotilov, P. Lavrov, and A. Sigov, "Effect of leakage and relaxation losses in the determination the hysteresis parameters of the ferroelec- tric nanostructure," J. Nanomater. Nanostruct. -XXI Century 2(7), 20-29 (2016) (in Russian ISSN 2225-0999).
- L. Jin, F. Li, and S. Zhang, "Decoding the fingerprint of ferroelectrics loops: Comprehension of the material properties and structures," J. Am. Ceram. Soc. 97(1), 1-27 (2014). · DOI
- N. M. Kotova, K. A. Vorotilov, D. S. Seregin, and A. S. Sigov, "Role of precur- sors in the formation of lead zirconate titanate thin films," Inorg. Mater. 50(6), 612-616 (2014). · DOI
- Yu. Podgorny, K. Vorotilov, P. Lavrov, and A. Sigov, "Leakage currents in porous PZT films," Ferroelectrics 503(1), 77-84 (2016). · DOI · Paper page
- S. L. Miller, R. D. Nasby, J. R. Schwank, M. S. Rodgers, and P. V. Dressendorfer, "Device modeling of ferroelectric capacitors," J. Appl. Phys. 68, 6463-6471 (1990). · DOI
- Y. Podgorny, K. Vorotilov, and A. Sigov, "Estimation of steady-state leakage current in polycrystalline PZT thin films," AIP Adv. 6, 095025 (2016). · DOI
- S. M. Sze and K. Ng Kwok, Physics of Semiconductor Devices, 3rd ed. (John Wiley and Sons, New York, 2007).
- C. Zhou and D. M. Newns, "Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors," J. Appl. Phys. 82, 3081-3088 (1997). · DOI
- P. Zubko, J. C. Wojdeł, M. Hadjimichael, S. F. Pena, A. Sen e, I. Lukyanchuk, J.-M. Triscone, and J. Iñiguez, Nature 534, 524-527 (2016). · DOI
- J. F. Scott and J. Gardner, "Ferroelectrics," Mater. Today 21, 553-562 (2018). · DOI
- A. M. Bratkovsky and A. P. Levanyuk, Phys. Rev. Lett. 84, 3177 (2000). · DOI
- E. A. Eliseev and A. N. Morozovska, J. Mater. Sci. 44, 5149-5160 (2009). · DOI
Cited by
Sorted by citations
Control of Columnar Grain Microstructure in CSD LaNiO3 Films
Atanova, A. V., Seregin, D. S., Zhigalina, O. M., Khmelenin, D. N., Orlov, G. A., Turkina, D. I., Sigov, A. S., & Vorotilov, K. A. (2023) · Molecules · doi:10.3390/molecules28041938 · Cited by 5 · see citing works
Self-citation
- Authors
- Podgorny, Y. V., Vorotilov, K. A., Sigov, A. S., & Scott, J. F.
- Affiliations
- MIREA - Russian Technological University (RU)
- University of St Andrews (GB)
- Corresponding author
- Scott, J. F.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2019-04-01
- Volume
- 114
- Issue
- 13
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2930778639
- Cited by
- 21
- References
- 0
- Citations by year
- 2026: 4 · 2025: 4 · 2024: 1 · 2023: 3 · 2022: 3 · 2021: 1 · 2020: 3 · 2019: 2
- FWCI
- 0.81
- Type
- journal article
- Language
- en
- Open access
- bronze
- doi.org
- Locations
- Applied Physics Letters (publishedVersion)
- St Andrews Research Repository (St Andrews Research Repository) (submittedVersion)
- Funders
- Ministry of Education and Science of the Russian Federation (11.2259.2017, 3.5726.2017/8.9)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Physical Sciences › Engineering › Biomedical Engineering › Dielectric materials and actuators
- Keywords
- dead layer thickness, lead zirconate titanate, leakage current, relaxation losses, conductivity effects, negative capacitance
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