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Electrical Resistivity of Aluminum and Manganese

Desai, P. D., James, H. M., Ho, C. Y.·1984·Journal of Physical and Chemical Reference Data

Abstract

This work compiles, reviews, and discusses the available data and information on the electrical resistivity of aluminum and manganese and presents the recommended values resulting from critical evaluation, correlation, analysis, and synthesis of the available data and information. The recommended values presented are uncorrected and also corrected for the thermal expansion of the material and cover the temperature range from 1 K to above the melting point into the molten state for aluminum and to 700 K for manganese. The estimated uncertainties in most of the recommended values are about ±2% to ±5%.

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Metadata

Authors
Desai, P. D., James, H. M., & Ho, C. Y.
Venue
Journal of Physical and Chemical Reference Data
Published
1984-10-01
Volume
13
Issue
4
Pages
1131-1172
ISSN
  • 0047-2689 (ISSN-L)
  • 1529-7845
OpenAlex
W2034917758
Cited by
199
References
0
FWCI
1.37
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Electrical Resistivity of Aluminum and Manganese. https://app.cochat.ai/papers/10.1063/1.555725
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Desai, P. D., James, H. M., & Ho, C. Y. (1984). Electrical Resistivity of Aluminum and Manganese. Journal of Physical and Chemical Reference Data. https://doi.org/10.1063/1.555725

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.