Conductive SiO2/HfO2 distributed Bragg Reflector Achieved by Electrical Breakdown and Its Application in GaN-Based Light Emitters
Abstract
Owing to the excellent optical reflectivity with wavelength tunability, dielectric distributed Bragg reflectors (DBRs) have attracted considerable interest in GaN-based light emitters. Yet, the non-conductive nature of the dielectric DBRs prevents current from passing through, leading to a current crowding effect and hampering dielectric DBRs from unlocking their full potential. In this paper, a conductive dielectric DBR was fabricated utilizing the electrical breakdown (EBD) technique. With the help of optical simulations, excellent optical properties were demonstrated by optimizing the structural designs with a high reflectivity of 98.3% at 450 nm based on 5.5 pairs SiO2/HfO2 DBRs. The outstanding electrical behaviors after the EBD process were verified by current–voltage curves and conductive atomic force microscopy characterization. Moreover, conductive mechanisms of this type of dielectric DBR were elaborated by comparing the EBD behaviors with different metal electrodes, suggesting that metal filaments play an important role in forming the conducting channels. Besides, 450 nm-emission with conductive 5.5 pairs SiO2/HfO2 DBR was successfully prepared, which proves that a conductive DBR can be successfully applied to GaN-based light-emitting devices. The conductive DBR presented in this work contributes to the acceleration of the development of high-power GaN-based solid-state light emitters.
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The SiO2/TiO2 pair offers the largest optical contrast, making it suitable for high-reflectance dielectric mirrors with a smaller number of pairs and sharper stopbands.
“However, the pair SiO2/TiO2 offers the largest optical contrast, rendering it perfect for high-reflectance dielectric mirrors with a smaller number of pairs and sharper stopbands.”
From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [29]
Silicon dioxide (SiO2) is the most commonly used material to fabricate dielectric mirrors.
“The most commonly used material to fabricate dielectric mirrors is silicon dioxide (SiO2).”
From Metal Oxide Thin Films for Advanced Photonic Applications (2026) · cites this paper as [29]
Cites
Atomic structure of conducting nanofilaments in TiO2 resistive switching memory
Kwon, D.-H., Kim, K. M., Jang, J. H., Jeon, J. M., Lee, M. H., Kim, G. H., Li, X.-S., Park, G.-S., Lee, B., Han, S., et al. (2010) · Nature Nanotechnology · doi:10.1038/nnano.2009.456 · Cited by 2,092 · see citing works
A surface-emitting laser incorporating a high-index-contrast subwavelength grating
Huang, M. C. Y., Zhou, Y., & Chang-Hasnain, C. J. (2007) · Nature Photonics · doi:10.1038/nphoton.2006.80 · Cited by 612 · see citing works
Gold: a relatively new catalyst
Bond, G. C. (2002) · Catalysis Today · doi:10.1016/s0920-5861(01)00522-3 · Cited by 249 · see citing works
Guo, X., & Schubert, E. F. (2001) · Applied Physics Letters · doi:10.1063/1.1372359 · Cited by 224 · see citing works
Bipolar resistive switching in polycrystalline TiO2 films
Tsunoda, K., Fukuzumi, Y., Jameson, J. R., Wang, Z., Griffin, P. B., & Nishi, Y. (2007) · Applied Physics Letters · doi:10.1063/1.2712777 · Cited by 213 · see citing works
Conductance quantization and synaptic behavior in a Ta2O5-based atomic switch
Tsuruoka, T., Hasegawa, T., Terabe, K., & Aono, M. (2012) · Nanotechnology · doi:10.1088/0957-4484/23/43/435705 · Cited by 181 · see citing works
Instability of gold oxide Au2O3
Tsai, H.-C., Hu, E., Perng, K., et al. (2003) · Surface Science · doi:10.1016/s0039-6028(03)00640-x · Cited by 174 · see citing works
Resistance switching of copper doped MoOx films for nonvolatile memory applications
Lee, D., Seong, D.-J., Jo, I., Xiang, F., Dong, R., Oh, S., & Hwang, H. (2007) · Applied Physics Letters · doi:10.1063/1.2715002 · Cited by 148 · see citing works
Combustion of Metals in Oxygen
GROSSE, A. V., & Conway, J. B. (1958) · Industrial & Engineering Chemistry · doi:10.1021/ie50580a040 · Cited by 146 · see citing works
Schubert, M. F., Xi, J.-Q., Kim, J. K., & Schubert, E. F. (2007) · Applied Physics Letters · doi:10.1063/1.2720269 · Cited by 136 · see citing works
Resistive switching and conductance quantization in Ag/SiO2/indium tin oxide resistive memories
Gao, S., Chen, C., Zhai, Z., Liu, H. Y., Lin, Y., Li, S. Z., Lu, S., Wang, G. Y., Song, C., Zeng, F., et al. (2014) · Applied Physics Letters · doi:10.1063/1.4893277 · Cited by 99 · see citing works
Resonant-cavity InGaN quantum-well blue light-emitting diodes
Song, Y., Diagne, M., Zhou, H., et al. (2000) · Applied Physics Letters · doi:10.1063/1.1310625 · Cited by 93 · see citing works
Liu, W.-J., Hu, X., Ying, L. Y., et al. (2014) · Applied Physics Letters · doi:10.1063/1.4885384 · Cited by 87 · see citing works
Gao, S., Liu, G., Chen, Q., Xue, W., Yang, H., Shang, J., Chen, B., Zeng, F., Song, C., Pan, F., et al. (2018) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.7b19586 · Cited by 83 · see citing works
Kao, C.-C., Peng, Y. C., Yao, H. H., Tsai, J. Y., Chang, Y. H., Chu, J. T., Huang, H.-W., Kao, T., Lu, T., Kuo, H., et al. (2005) · Applied Physics Letters · doi:10.1063/1.2032598 · Cited by 71 · see citing works
Kuramoto, M., Kobayashi, S., Akagi, T., et al. (2018) · Applied Physics Letters · doi:10.1063/1.5020229 · Cited by 69 · see citing works
Mishkat-Ul-Masabih, S. M., Aragon, A. A., Monavarian, M., et al. (2019) · Applied Physics Express · doi:10.7567/1882-0786/ab0576 · Cited by 62 · see citing works
Effects of Lateral Optical Confinement In GaN VCSELs With Double Dielectric DBRs
Xu, R., Mei, Y., Xu, H., et al. (2020) · IEEE photonics journal · doi:10.1109/jphot.2020.2979564 · Cited by 58 · see citing works
Self-citationInGaN Light-Emitting Diodes with an Embedded Nanoporous GaN Distributed Bragg Reflectors
Shiu, G.-Y., Chen, K., Fan, F., et al. (2016) · Scientific Reports · doi:10.1038/srep29138 · Cited by 54 · see citing works
Yeh, P. S., Chang, C., Chen, Y. T., et al. (2016) · Applied Physics Letters · doi:10.1063/1.4972182 · Cited by 52 · see citing works
ElAfandy, R. T., Kang, J.-H., Li, B., et al. (2020) · Applied Physics Letters · doi:10.1063/5.0012281 · Cited by 51 · see citing works
Bipolar resistive switching characteristics in CuO/ZnO bilayer structure
Yang, F., Wei, M., & Deng, H. (2013) · Journal of Applied Physics · doi:10.1063/1.4821237 · Cited by 49 · see citing works
Zhang, L., Zhu, L., Li, X., Xu, Z. Q., Wang, W., & Bai, X. (2017) · Scientific Reports · doi:10.1038/srep45143 · Cited by 46 · see citing works
Sheng, X., Liu, J., Coronel, N. C., et al. (2010) · IEEE Photonics Technology Letters · doi:10.1109/lpt.2010.2060717 · Cited by 43 · see citing works
AlGaN-Based Deep Ultraviolet Vertical-Cavity Surface-Emitting Laser
Zheng, Z., Mei, Y., Long, H., et al. (2021) · IEEE Electron Device Letters · doi:10.1109/led.2021.3052725 · Cited by 37 · see citing works
Lai, Y.-Y., Huang, S.-C., Ho, T.-L., et al. (2014) · Optics Express · doi:10.1364/oe.22.009789 · Cited by 22 · see citing works
Tien, W. C., & Chu, A. K. (2013) · Solar Energy Materials and Solar Cells · doi:10.1016/j.solmat.2013.08.003 · Cited by 18 · see citing works
Oh, S. H., Lee, T. H., Son, K. R., et al. (2018) · Journal of Alloys and Compounds · doi:10.1016/j.jallcom.2018.09.287 · Cited by 17 · see citing works
GaN-Based High-$Q$ Vertical-Cavity Light-Emitting Diodes
Lu, T., Kao, T., Kao, C.-C., et al. (2007) · IEEE Electron Device Letters · doi:10.1109/led.2007.904906 · Cited by 16 · see citing works
Sarzała, R. P., Śpiewak, P., Nakwaski, W., & Wasiak, M. (2020) · Optics & Laser Technology · doi:10.1016/j.optlastec.2020.106482 · Cited by 12 · see citing works
ITO DBR Electrodes Fabricated on PET Substrate for Organic Electronics
Tien, W. C., & Chu, A. K. (2014) · Optics Express · doi:10.1364/oe.22.003944 · Cited by 11 · see citing works
Bias-temperature stress of Al on porous low-k dielectrics
He, M. Z., Li, H., Wang, P., et al. (2011) · Microelectronics Reliability · doi:10.1016/j.microrel.2011.03.004 · Cited by 9 · see citing works
Creazzo, T., Redding, B., Marchena, E., et al. (2010) · Thin Solid Films · doi:10.1016/j.tsf.2010.02.023 · Cited by 8 · see citing works
InGaN-based resonant-cavity light-emitting diodes with dielectric-distributed Bragg reflectors
Kim, J., & Park, S. (2013) · Journal of the Korean Physical Society · doi:10.3938/jkps.63.2008 · Cited by 3 · see citing works
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Metal Oxide Thin Films for Advanced Photonic Applications
Stîngescu, M.-L., Șopronyi, M.-A., Antohe, Ș., & Scărișoreanu, N.-D. (2026) · Crystals · doi:10.3390/cryst16030164 · Cited by 2 · see citing works
- Authors
- Cui, M., Guo, C., Yang, Z., Chen, L., Dai, Y., Xu, H., Guo, W., & Ye, J.
- Affiliations
- Chinese Academy of Sciences (CN)
- University of Science and Technology of China (CN)
- University of Nottingham Ningbo China (CN)
- Corresponding author
- Guo, Wei
- Ye, Jichun
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2022-01-25
- Volume
- 131
- Issue
- 4
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W4206996424
- Cited by
- 7
- References
- 34
- Citations by year
- 2026: 3 · 2025: 1 · 2024: 1 · 2023: 1 · 2022: 1
- FWCI
- 0.37
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Applied Physics (publishedVersion)
- Funders
- Youth Innovation Promotion Association (2020298)
- National Natural Science Foundation of China (61974149)
- Instrument Developing Project of the Chinese Academy of Sciences (YJKYYQ20190074)
- Natural Science Foundation of Zhejiang Province (LQ21F040004)
- Science and Technology Innovation 2025 Major Project of Ningbo (2020Z020)
- Primary Research and Development Plan of Zhejiang Province (2020C01145)
- Topics
- Physical Sciences › Physics and Astronomy › Condensed Matter Physics › GaN-based semiconductor devices and materials
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Optical Coatings and Gratings
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Semiconductor materials and devices
- Keywords
- distributed Bragg reflector, electrical breakdown, current crowding, metal filaments, conduction mechanism, high reflectivity
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