Cited by 165Microstructure and mechanical propertiesSilicon Carbide Semiconductor TechnologiesAdvanced ceramic materials synthesis

The DOI matches its Crossref record; 28 of the 28 references it cites were found in a registry or an index.

Defects in plastically deformed 6H SiC single crystals studied by transmission electron microscopy

Maeda, K., Suzuki, K., Fujita, S., Ichihara, M., Hyodo, S.·1988·Philosophical Magazine A

Abstract

Transmission electron microscopic studies have been performed on lattice defects in 6H silicon carbide single crystals; the crystals were subjected to microhardness indentation tests between room temperature and 1200°C and then to uniaxial compression at temperatures from 1100 to 1650°C. It was observed that their basal dislocations, the main defects introduced by deformation, were dissociated into Shockley partials separated by very wide stacking faults, the energy of which was evaluated to be 2.5 ± 0·9 mJ m−2. The lineshapes of the partials varied considerably, depending on the sign and angle (with the dislocation line) of the Burgers vector; this suggests that the mobility of the partials is affected by the geometry of dislocations. The fact that basal dislocations were aligned more or less in crystallographic 〈1120〉 directions indicates the presence of a high Peierls potential. Macroplastic deformation was observed above 1000°C. This critical temperature seems to be determined by the motion of the least mobile partials. The ductile–brittle transition occurred between 800 and 1000°C. This transition is considered to have been induced by the temperature-enhanced mobilization of the slowest partials or by the thermally activated constriction of dissociated pairs, both of which are prerequisites for dislocation multiplication. The hardness of the crystals showed a strong temperature dependence below 800°C. This can be explained by assuming that, although no dislocation multiplication occurs, only very mobile partials experience thermally activated glide. Other implications of the experimental findings are discussed.

Overview

Integrity signals

Registry

Crossref · 10.1080/01418618808214408

Cites

28 of 28 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Zhurong is powered by four solar panels and carries six scientific instruments for exploring Mars.

    “Zhurong is powered by four solar panels and carries six scientific instruments for exploring Mars.”
  • Zhurong has ten containers of nundecane stored under two circular windows on the deck, which utilize the temperature difference between day and night to absorb and release energy.

    “Besides, Zhurong has ten containers of nundecane stored under two circular windows on the deck, which utilize the temperature difference between day and night to absorb and release energy. 207”

Citations

Cites

Flagged first, then by citations

Research works printed but not linked: 5

  1. Daniels F. W., 1949, Trans. Am. Soc. Metals, 41, 419
  2. Griffiths L. B., 1966, J. Phys. Chem. Solids, 27, 25
  3. Hirsch, P. B., Ourmazd, A. and Pirouz, P. Microscopy of Semiconducting Materials. Inst. Phys. Conf. Ser. No. 60. 1981. Edited by: Cullis, A. G. and Joy, D. C. pp.29London: The Institute of Physics.
  4. Knippenberg W. F., 1963, Philips Res. Rep., 18, 161
  5. Popp G., 1964, Commun. Am. Ceram. Soc., 1, 18

Cited by

Sorted by citations

Metadata

Authors
Maeda, K., Suzuki, K., Fujita, S., Ichihara, M., & Hyodo, S.
Affiliations
  • The University of Tokyo (JP)
  • The Institute for Solid State Physics, The University of Tokyo (JP)
Venue
Philosophical Magazine A
Published
1988-04
Volume
57
Issue
4
Pages
573-592
ISSN
  • 0141-8610 (ISSN-L)
  • 1460-6992
OpenAlex
W2025516977
Cited by
165
References
28
Citations by year
2026: 1 · 2025: 1 · 2024: 8 · 2023: 2 · 2022: 1 · 2021: 4 · 2020: 2 · 2019: 3 · 2018: 4 · 2017: 3 · 2016: 3 · 2015: 5 · 2014: 2 · 2013: 4 · 2012: 5
FWCI
4.35
Type
journal article
Language
en
Open access
closed
Locations
Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties (publishedVersion)
Topics
  • Physical Sciences › Materials Science › Metals and Alloys › Microstructure and mechanical properties
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Materials Science › Ceramics and Composites › Advanced ceramic materials synthesis
Keywords
6H-SiC, basal plane dislocations, dislocation dissociation, Shockley partial dislocations, stacking faults, Peierls potential, dislocation motion, ductile-to-brittle transition, dislocation multiplication, plastic deformation, microhardness, high-temperature deformation

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review