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Effect of heavy doping on the optical properties and the band structure of silicon

Viña, L., Cardona, M.·1984·Physical Review B

Abstract

We have measured by ellipsometry the dielectric constant of pure and heavily doped $n$- and $p$- type silicon from 1.8 to 5.6 eV. Both ion-implanted laser-annealed and bulk doped samples were used with concordant results. A red shift of the ${E}_{1}$ and ${E}_{2}$ critical-point energies, together with a decrease in the excitonic interaction at the ${E}_{1}$ energy, has been observed. These results are compared with first- and second-order perturbation-theory calculations of the effect of the impurities on the band structure of silicon.

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Metadata

Authors
Viña, L., & Cardona, M.
Venue
Physical Review B
Published
1984-06-15
Volume
29
Issue
12
Pages
6739-6751
ISSN
0163-1829 (ISSN-L)
OpenAlex
W2024706078
Cited by
160
References
0
FWCI
10.28
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Effect of heavy doping on the optical properties and the band structure of silicon. https://app.cochat.ai/papers/10.1103/physrevb.29.6739
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Viña, L., & Cardona, M. (1984). Effect of heavy doping on the optical properties and the band structure of silicon. Physical Review B. https://doi.org/10.1103/physrevb.29.6739

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