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Heteroepitaxial graphite on6H−SiC(0001): Interface formation through conduction-band electronic structure

Forbeaux, I., Themlin, J.-M., Debever, J.-M.·1998·Physical Review B

Abstract

When annealed at elevated temperatures under vacuum, silicon carbide surfaces show a tendency towards graphitization. Using the sensitivity of empty conduction-band states dispersion towards the structural quality of the overlayer, we have used angular-resolved inverse photoemission spectroscopy (KRIPES) to monitor the progressive formation of crystalline graphite on $6H\ensuremath{-}\mathrm{SiC}(0001)$ surfaces. The KRIPES spectra obtained after annealing at 1400 \ifmmode^\circ\else\textdegree\fi{}C are characteristic of azimuthally oriented, graphite multilayers of very good single-crystalline quality. For lower annealing temperatures, the ordered interface already presents most of the fingerprints of graphite as soon as 1080 \ifmmode^\circ\else\textdegree\fi{}C. The observation of unshifted ${\ensuremath{\pi}}^{*}$ states, which reveals a very weak interaction with the substrate, is consistent with the growth of a van der Waals heteroepitaxial graphite lattice on top of silicon carbide, with a coincidence lattice of $(6\sqrt{3}\ifmmode\times\else\texttimes\fi{}6\sqrt{3})R30\ifmmode^\circ\else\textdegree\fi{}$ symmetry. The growth of the first graphene sheet proceeds on top of adatoms characteristic of the $(\sqrt{3}\ifmmode\times\else\texttimes\fi{}\sqrt{3})R30\ifmmode^\circ\else\textdegree\fi{}$ reconstruction. These adatoms reduce the chemical reactivity of the substrate. A strong feature located at 6.5 eV above the Fermi level is attributed to states derived from Si vacancies in the C-rich subsurface layers of the SiC substrate. This strongly perturbed substrate can be viewed as a diamondlike phase which acts as a precursor to graphite formation by collapse of several layers. In this framework, previously published soft x-ray photoemission spectra find a natural explanation.

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Crossref · 10.1103/physrevb.58.16396

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Authors
Forbeaux, I., Themlin, J.-M., & Debever, J.-M.
Venue
Physical Review B
Published
1998-12-15
Volume
58
Issue
24
Pages
16396-16406
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W1997613934
Cited by
703
References
0
FWCI
1.21
Type
journal article
Language
en
Open access
closed

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