The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.
Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons
Open accessAbstract
Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized $\mathrm{SiC}(0001)$. The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite thickness. Conduction bands in thin graphite films form discrete energy levels whose wave vectors are normal to the surface. Resonance of the incident electrons with these quantized conduction band states enhances electrons to transmit through the film into the $\mathrm{SiC}$ substrate, resulting in dips in the reflectivity. The dip positions are well explained using tight-binding and first-principles calculations. The graphite thickness distribution can be determined microscopically from LEEM reflectivity measurements.
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Cites
Two-dimensional gas of massless Dirac fermions in graphene
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Katsnelson, M. I., Grigorieva, I. V., Dubonos, S. V., & Firsov, A. A. (2005) · Nature · doi:10.1038/nature04233 · Cited by 21,611
Experimental observation of the quantum Hall effect and Berry's phase in graphene
Zhang, Y., Tan, Y.-W., Stormer, H. L., & Kim, P. (2005) · Nature · doi:10.1038/nature04235 · Cited by 13,435
Berger, C., Song, Z., Li, T., Li, X., Ogbazghi, A. Y., Feng, R., Dai, Z., Marchenkov, A. N., Conrad, E. H., First, P. N., et al. (2004) · The Journal of Physical Chemistry B · doi:10.1021/jp040650f · Cited by 3,548
Cited by
Towards wafer-size graphene layers by atmospheric pressure graphitization of silicon carbide
Emtsev, K. V., Bostwick, A., Horn, K., Jobst, J., Kellogg, G. L., Ley, L., McChesney, J. L., Ohta, T., Reshanov, S. A., Röhrl, J., et al. (2009) · Nature Materials · doi:10.1038/nmat2382 · Cited by 2,651
Carbon Nanomaterials in Biosensors: Should You Use Nanotubes or Graphene?
Yang, W., Ratinac, K. R., Ringer, S. P., Thordarson, P., Gooding, J. J., & Braet, F. (2010) · Angewandte Chemie International Edition · doi:10.1002/anie.200903463 · Cited by 1,431
Lauffer, P., Emtsev, K. V., Graupner, R., Seyller, T., Ley, L., Reshanov, S. A., & Weber, H. B. (2008) · Physical Review B · doi:10.1103/physrevb.77.155426 · Cited by 386
Hibino, H., Kageshima, H., Kotsugi, M., Maeda, F., Guo, F.-Z., & Watanabe, Y. (2009) · Physical Review B · doi:10.1103/physrevb.79.125437 · Cited by 278
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Metadata
- Authors
- Hibino, H., Kageshima, H., Maeda, F., Nagase, M., Kobayashi, Y., & Yamaguchi, H.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 2008-02-15
- Volume
- 77
- Issue
- 7
- ISSN
- 1098-0121 (ISSN-L)
- 1550-235X
- OpenAlex
- W2031391367
- Cited by
- 362
- References
- 3
- FWCI
- 18.56
- Type
- journal article
- Language
- en
- Open access
- green
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- Hibino, H., Kageshima, H., Maeda, F., Nagase, M., Kobayashi, Y., & Yamaguchi, H. (2008). Microscopic thickness determination of thin graphite films formed onSiCfrom quantized oscillation in reflectivity of low-energy electrons. Physical Review B. https://doi.org/10.1103/physrevb.77.075413
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