The DOI matches its Crossref record; 22 of the 22 references it cites were found in a registry or an index.
Dependence of electronic properties of epitaxial few-layer graphene on the number of layers investigated by photoelectron emission microscopy
Abstract
We used spectroscopic photoemission and low-energy electron microscopy to investigate the electronic properties of epitaxial few-layer graphene grown on 6H-SiC(0001). Photoelectron emission microscopy (PEEM) images using secondary electrons (SEs) and $\text{C}\text{ }1s$ photoelectrons can discriminate areas with different numbers of graphene layers. The SE emission spectra indicate that the work function increases with the number of graphene layers and that unoccupied states in the few-layer graphene promote SE emission. The $\text{C}\text{ }1s$ PEEM images indicate that the $\text{C}\text{ }1s$ core level shifts to lower binding energies as the number of graphene layers increases, which is consistent with the reported thickness dependence of the Dirac point energy.
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Substrate-induced bandgap opening in epitaxial graphene
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Quasiparticle dynamics in graphene
Bostwick, A., Ohta, T., Seyller, T., Horn, K., & Rotenberg, E. (2007) · Nature Physics · doi:10.1038/nphys477 · Cited by 1,160
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Ultrafast non-volatile flash memory based on van der Waals heterostructures
Liu, L., Liu, C., Jiang, L., Li, J., Ding, Y., Wang, S., Jiang, Y.-G., Sun, Y.-B., Wang, J., Chen, S., et al. (2021) · Nature Nanotechnology · doi:10.1038/s41565-021-00921-4 · Cited by 265
Metadata
- Authors
- Hibino, H., Kageshima, H., Kotsugi, M., Maeda, F., Guo, F.-Z., & Watanabe, Y.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 2009-03-30
- Volume
- 79
- Issue
- 12
- ISSN
- 1098-0121 (ISSN-L)
- 1550-235X
- OpenAlex
- W2077793170
- Cited by
- 278
- References
- 22
- FWCI
- 10.05
- Type
- journal article
- Language
- en
- Open access
- closed
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- Hibino, H., Kageshima, H., Kotsugi, M., Maeda, F., Guo, F.-Z., & Watanabe, Y. (2009). Dependence of electronic properties of epitaxial few-layer graphene on the number of layers investigated by photoelectron emission microscopy. Physical Review B. https://doi.org/10.1103/physrevb.79.125437
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