The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.
Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy
Abstract
We present a method to prepare monolayer and multilayer suspended sheets of hexagonal boron nitride (h-BN), using a combination of mechanical exfoliation and reactive ion etching. Ultrahigh-resolution transmission electron microscope imaging is employed to resolve the atoms, and intensity profiles for reconstructed phase images are used to identify the chemical nature (boron or nitrogen) of every atom throughout the sample. Reconstructed phase images are distinctly different for h-BN multilayers of even or odd number. Unusual triangular defects and zigzag and armchair edge reconstructions are uniquely identified and characterized.
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Cites
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Self-citationWatanabe, K., Taniguchi, T., & Kanda, H. (2004) · Nature Materials · doi:10.1038/nmat1134 · Cited by 3,057
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Self-citationDirect Imaging of Lattice Atoms and Topological Defects in Graphene Membranes
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Electronics and optoelectronics of two-dimensional transition metal dichalcogenides
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Large Scale Growth and Characterization of Atomic Hexagonal Boron Nitride Layers
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Boron Nitride Nanotubes and Nanosheets
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Structure, Properties and Applications of Two‐Dimensional Hexagonal Boron Nitride
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Thermal Conductivity and Phonon Transport in Suspended Few-Layer Hexagonal Boron Nitride
Jo, I., Pettes, M. T., Kim, J., Watanabe, K., Taniguchi, T., Yao, Z., & Shi, L. (2013) · Nano Letters · doi:10.1021/nl304060g · Cited by 770
Metadata
- Authors
- Alem, N., Erni, R., Kisielowski, C., Rossell, M. D., Gannett, W., & Zettl, A.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 2009-10-12
- Volume
- 80
- Issue
- 15
- ISSN
- 1098-0121 (ISSN-L)
- 1550-235X
- OpenAlex
- W2060671706
- Cited by
- 543
- References
- 17
- FWCI
- 14.99
- Type
- journal article
- Language
- en
- Open access
- closed
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- Alem, N., Erni, R., Kisielowski, C., Rossell, M. D., Gannett, W., & Zettl, A. (2009). Atomically thin hexagonal boron nitride probed by ultrahigh-resolution transmission electron microscopy. Physical Review B. https://doi.org/10.1103/physrevb.80.155425
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