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Cited by 556

The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.

Spectroscopic ellipsometry of graphene and an exciton-shifted van Hove peak in absorption

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Kravets, V. G., Grigorenko, A. N., Nair, R. R., Blake, P., Anissimova, S., Novoselov, K. S., Geim, A. K.·2010·Physical Review B

Abstract

We demonstrate that optical transparency of any two-dimensional system with a symmetric electronic spectrum is governed by the fine structure constant and suggest a simple formula that relates a quasiparticle spectrum to an optical absorption of such a system. These results are applied to graphene deposited on a surface of oxidized silicon for which we measure ellipsometric spectra, extract optical constants of a graphene layer and reconstruct the electronic dispersion relation near the $K$ point using optical transmission spectra. We also present spectroscopic ellipsometry analysis of graphene placed on amorphous quartz substrates and report a pronounced peak in ultraviolet absorption at 4.6 eV because of a van Hove singularity in graphene's density of states. The peak is asymmetric and downshifted by 0.5 eV probably due to excitonic effects.

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Metadata

Authors
Kravets, V. G., Grigorenko, A. N., Nair, R. R., Blake, P., Anissimova, S., Novoselov, K. S., & Geim, A. K.
Venue
Physical Review B
Published
2010-04-06
Volume
81
Issue
15
ISSN
  • 1098-0121 (ISSN-L)
  • 1550-235X
OpenAlex
W2013672468
Cited by
556
References
5
FWCI
18.22
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Spectroscopic ellipsometry of graphene and an exciton-shifted van Hove peak in absorption. https://app.cochat.ai/papers/10.1103/physrevb.81.155413
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Kravets, V. G., Grigorenko, A. N., Nair, R. R., Blake, P., Anissimova, S., Novoselov, K. S., & Geim, A. K. (2010). Spectroscopic ellipsometry of graphene and an exciton-shifted van Hove peak in absorption. Physical Review B. https://doi.org/10.1103/physrevb.81.155413

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