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Cited by 187

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Quantitative x-ray phase nanotomography

Open access
Diaz, Ana, Trtik, Pavel, Guizar-Sicairos, Manuel, Menzel, Andreas, Thibault, Pierre, Bunk, Oliver·2012·Physical Review B

Abstract

X-ray ptychographic computed tomography has recently emerged as a nondestructive characterization tool for samples with representative sizes of several tens of micrometers, yet offering a resolution currently lying in but not limited to the 100-nm range. Here we evaluate the quantitativeness of this technique using a model sample with a known structure and density, and we discuss its sensitivity as a function of resolution. Additionally, we show an example application for the determination of the mass density of individual $2\ensuremath{-}\ensuremath{\mu}$m-sized SiO${}_{2}$ microspheres with a relative error of 2$%$. The accuracy and sensitivity demonstrated in this paper will enable quantitative imaging, segmentation, and identification of different phases in complex materials at the nanoscale.

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Metadata

Authors
Diaz, A., Trtik, P., Guizar-Sicairos, M., Menzel, A., Thibault, P., & Bunk, O.
Venue
Physical Review B
Published
2012-01-31
Volume
85
Issue
2
ISSN
  • 1098-0121 (ISSN-L)
  • 1550-235X
OpenAlex
W2320440460
Cited by
187
References
1
FWCI
13.96
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Quantitative x-ray phase nanotomography. https://app.cochat.ai/papers/10.1103/physrevb.85.020104
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Diaz, A., Trtik, P., Guizar-Sicairos, M., Menzel, A., Thibault, P., & Bunk, O. (2012). Quantitative x-ray phase nanotomography. Physical Review B. https://doi.org/10.1103/physrevb.85.020104

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