The DOI matches its Crossref record.
Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K
Abstract
Strong intensity oscillations have been found in RHEED during epitaxial growth at 77 K. This temperature is too low for thermally activated diffusion and establishes that the deposited atom uses its latent heat of condensation to skip across the surface, preferentially coming to rest at growing island edges, to achieve quasi---layer-by-layer growth. This growth mechanism implies that RHEED oscillations should be observable at 0 K. The data also provide insight into the basic principles governing RHEED oscillations.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Extending the Time Scale in Atomistic Simulation of Materials
Voter, A. F., Montalenti, F., & Germann, T. C. (2002) · Annual Review of Materials Research · doi:10.1146/annurev.matsci.32.112601.141541 · Cited by 700
Reentrant layer-by-layer growth during molecular-beam epitaxy of metal-on-metal substrates
Kunkel, R., Poelsema, B., Verheij, L. K., & Comsa, G. (1990) · Physical Review Letters · doi:10.1103/physrevlett.65.733 · Cited by 498
The intrinsic stress of polycrystalline and epitaxial thin metal films
Koch, R. (1994) · Journal of Physics: Condensed Matter · doi:10.1088/0953-8984/6/45/005 · Cited by 451
Existence of a “Hot” Atom Mechanism for the Dissociation ofO2on Pt(111)
Wintterlin, J., Schuster, R., & Ertl, G. (1996) · Physical Review Letters · doi:10.1103/physrevlett.77.123 · Cited by 296
(1999) · doi:10.1002/(sici)1521-396x(199905)173:1<51::aid-pssa51>3.0.co;2-o
Metadata
- Authors
- Egelhoff, W. F., & Jacob, I.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1989-02-20
- Volume
- 62
- Issue
- 8
- Pages
- 921-924
- ISSN
- 0031-9007 (ISSN-L)
- OpenAlex
- W2033844370
- Cited by
- 294
- References
- 0
- FWCI
- 14.81
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K. https://app.cochat.ai/papers/10.1103/physrevlett.62.921
- The paper
- Egelhoff, W. F., & Jacob, I. (1989). Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K. Physical Review Letters. https://doi.org/10.1103/physrevlett.62.921
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.