The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.
Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics
Open accessAbstract
Epitaxial strain can substantially enhance the spontaneous polarizations and Curie temperatures of ferroelectric thin films compared to the corresponding bulk materials. In this Letter we use first principles calculations to calculate the effect of epitaxial strain on the spontaneous polarization of the ferroelectrics , , and , and the multiferroic material . We show that the epitaxial strain dependence of the polarization varies considerably for the different systems, and in some cases is, in fact, very small. We discuss possible reasons for this different behavior and show that the effect of epitaxial strain can easily be understood in terms of the piezoelectric and elastic constants of the unstrained materials. Our results provide a computational tool for the quantitative prediction of strain behavior in ferroelectric thin films.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Projector augmented-wave method
Blöchl, P. E. (1994) · Physical Review B · doi:10.1103/physrevb.50.17953 · Cited by 92,732
From ultrasoft pseudopotentials to the projector augmented-wave method
Kresse, G., & Joubert, D. (1999) · Physical Review B · doi:10.1103/physrevb.59.1758 · Cited by 85,307
Kresse, G., & Furthmüller, J. (1996) · Computational Materials Science · doi:10.1016/0927-0256(96)00008-0 · Cited by 75,638
Electron-energy-loss spectra and the structural stability of nickel oxide: An LSDA+U study
Dudarev, S. L., Botton, G. A., Savrasov, S. Y., Humphreys, C. J., & Sutton, A. P. (1998) · Physical Review B · doi:10.1103/physrevb.57.1505 · Cited by 15,173
Principles and Applications of Ferroelectrics and Related Materials
Lines, M. E., & Glass, A. M. (2001) · Oxford University Press eBooks · doi:10.1093/acprof:oso/9780198507789.001.0001 · Cited by 5,257
Theory of polarization of crystalline solids
King-Smith, R. D., & Vanderbilt, D. (1993) · Physical Review B · doi:10.1103/physrevb.47.1651 · Cited by 4,472
The density functional formalism, its applications and prospects
Jones, R. O., & Gunnarsson, O. (1989) · Reviews of Modern Physics · doi:10.1103/revmodphys.61.689 · Cited by 4,014
Physics of thin-film ferroelectric oxides
Dawber, M., Rabe, K. M., & Scott, J. F. (2005) · Reviews of Modern Physics · doi:10.1103/revmodphys.77.1083 · Cited by 2,296
Room-temperature ferroelectricity in strained SrTiO3
Haeni, J. H., Irvin, P., Chang, W., Uecker, R., Reiche, P., Li, Y. L., Choudhury, S., Tian, W., Hawley, M. E., Craigo, B., et al. (2004) · Nature · doi:10.1038/nature02773 · Cited by 2,176
Enhancement of Ferroelectricity in Strained BaTiO 3 Thin Films
Choi, K. J., Biegalski, M., Li, Y. L., Sharan, A., Schubert, J., Uecker, R., Reiche, P., Chen, Y. B., Pan, X. Q., Gopalan, V., et al. (2004) · Science · doi:10.1126/science.1103218 · Cited by 1,961
Cited by
Electrical control of antiferromagnetic domains in multiferroic BiFeO3 films at room temperature
Zhao, T., Scholl, A., Zavaliche, F., Lee, K., Barry, M., Doran, A., Cruz, M. P., Chu, Y. H., Ederer, C., Spaldin, N. A., et al. (2006) · Nature Materials · doi:10.1038/nmat1731 · Cited by 1,297
Self-citation
Metadata
- Authors
- Ederer, C., & Spaldin, N. A.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 2005-12-12
- Volume
- 95
- Issue
- 25
- Pages
- 257601-257601
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W1993552027
- Cited by
- 608
- References
- 23
- FWCI
- 8.87
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics. https://app.cochat.ai/papers/10.1103/physrevlett.95.257601
- The paper
- Ederer, C., & Spaldin, N. A. (2005). Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics. Physical Review Letters. https://doi.org/10.1103/physrevlett.95.257601
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
