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Cited by 185

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Charge-Fluctuation-Induced Dephasing of Exchange-Coupled Spin Qubits

Open access
Hu, Xuedong, Das Sarma, S.·2006·Physical Review Letters

Abstract

Exchange-coupled spin qubits in semiconductor nanostructures are shown to be vulnerable to dephasing caused by charge noise invariably present in the semiconductor environment. This decoherence of exchange gate by environmental charge fluctuations arises from the fundamental Coulombic nature of the Heisenberg coupling and presents a serious challenge to the scalability of the widely studied exchange gate solid state spin quantum computer architectures. We estimate dephasing times for coupled spin qubits in a wide range (from 1 ns up to >1 micros) depending on the exchange coupling strength and its sensitivity to charge fluctuations.

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Metadata

Authors
Hu, X., & Das Sarma, S.
Venue
Physical Review Letters
Published
2006-03-13
Volume
96
Issue
10
Pages
100501-100501
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W1983497176
Cited by
185
References
2
FWCI
7.30
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Charge-Fluctuation-Induced Dephasing of Exchange-Coupled Spin Qubits. https://app.cochat.ai/papers/10.1103/physrevlett.96.100501
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Hu, X., & Das Sarma, S. (2006). Charge-Fluctuation-Induced Dephasing of Exchange-Coupled Spin Qubits. Physical Review Letters. https://doi.org/10.1103/physrevlett.96.100501

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