Cited by 2,039Graphene research and applications2D Materials and ApplicationsQuantum and electron transport phenomena

The DOI matches its Crossref record; 14 of the 14 references it cites were found in a registry or an index; none of the 8 sources its claims cite is checked for support yet.

Biased Bilayer Graphene: Semiconductor with a Gap Tunable by the Electric Field Effect

Open access

Abstract

We demonstrate that the electronic gap of a graphene bilayer can be controlled externally by applying a gate bias. From the magnetotransport data (Shubnikov-de Haas measurements of the cyclotron mass), and using a tight-binding model, we extract the value of the gap as a function of the electronic density. We show that the gap can be changed from zero to midinfrared energies by using fields of less, approximately < 1 V/nm, below the electric breakdown of SiO2. The opening of a gap is clearly seen in the quantum Hall regime.

Overview

AI snapshot

Written from the paper’s full text.

TL;DR

The paper reports that bilayer graphene can be converted into a semiconductor whose band gap is externally tunable by gate bias, with the gap ranging from zero to mid-infrared energies. Magnetotransport measurements and tight-binding modeling show clear gap signatures, including a zero Hall conductivity plateau and an asymmetric cyclotron mass.

Key findings

  • In biased bilayer graphene, a plateau at zero Hall conductivity appears at the neutrality point, unlike the pristine case; the longitudinal resistivity at neutrality exceeded 150 kΩ at 4 K for the biased device, compared with 6 kΩ for the unbiased device under the same conditions.
  • The cyclotron mass depends asymmetrically on carrier density, and comparison with tight-binding theory yields an interlayer hopping parameter of 0.22 eV and indicates gaps larger than 0.2 eV.
  • A small-bias linear fit to the screened theory gives a gap of about 1.2 meV per volt relative to a gate voltage of 25 V, while the theory predicts gap saturation at the interlayer hopping scale.
  • The model agrees well with angle-resolved photoemission data, except in the gap saturation regime around densities of about 50 × 10¹² cm⁻².

Methods

  • Bilayer graphene devices were prepared by micromechanical cleavage on 300 nm SiO₂ and patterned into Hall bars; carrier density was controlled by a Si backgate and by NH₃ chemical doping, with transport measured by lock-in techniques in fields up to 12 T and temperatures from 4 to 300 K.
  • Shubnikov–de Haas oscillations were measured versus temperature and fitted to extract the cyclotron mass as a function of carrier density.
  • The data were interpreted with a Bernal-stacked bilayer tight-binding model using in-plane hopping of 3.1 eV and interlayer hopping of 0.22 eV, including a self-consistent Hartree treatment of screening; Hall conductivity was modeled for a zigzag-edged ribbon in a magnetic field.

Limitations

  • The paper states that the Hartree approach is reliable only when the gap is small compared with the interlayer hopping; for hole doping it underestimates the cyclotron mass while the unscreened model overestimates it, so the true gap lies between these limits and a better screening treatment is needed when the electrostatic energy becomes comparable to the interlayer hopping.
  • The paper notes that the comparison with angle-resolved photoemission data works well except in the gap saturation regime at high density.
  • Evident from the text: for the transport devices, the gap values are inferred by fitting a tight-binding/Hartree model to magnetotransport rather than measured directly by a spectroscopic probe.

Model-written summary. Check it against the paper before relying on it.

Integrity signals

Registry

Crossref · 10.1103/physrevlett.99.216802

Cites

14 of 14 references verified0 citation errors · 0 not checkable

Statistics

Nothing to recompute.

Verification

Claims the paper makes

0 of 8 cited sources checked · 0 supported · 0 flagged

Show all 37 claims

  • It may state two separate claims as one. 10
  • The quote only partly states this claim. 2
  • Probably not a substantial claim. 1
12 of 12
  • The authors state this as an assumption.

    The charge in layers 1 and 2 of the bilayer is equal to -ne/2.

    “Assuming equal charge ÿne=2 in layers 1 and 2 of the bilayer”
  • The paper relies on this without support.

    The breakdown field for SiO2 is 1 V/nm (i.e., 300 V for the used oxide thickness).

    “Note that the breakdown field for SiO 2 is 1 V=nm (i.e., 300 V for the used oxide thickness)”
  • The authors state this as an assumption.

    The electric field induced between the two layers can be considered as a result of the effect of charged surfaces placed above and below bilayer graphene.

    “The electric field induced between the two layers can be considered as a result of the effect of charged surfaces placed above and below bilayer graphene .”
3 of 3

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

Each contradiction between two passages listed here was confirmed by an independent check.

  • Laughlin is cited under the wrong reference number

    Minor

    The text attributes an argument to Laughlin [14], while the reference list assigns 14 to a note and lists Laughlin at 15.

1 of 1

Citations

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Metadata

Authors
Castro, E. V., Novoselov, K. S., Morozov, S. V., Peres, N. M. R., dos Santos, J. M. B. L., Nilsson, J., Guinea, F., Geim, A. K., & Neto, A. H. C.
Affiliations
  • Universidade do Porto (PT)
  • University of Manchester (GB)
  • University of Minho (PT)
  • Boston University (US)
  • Consejo Superior de Investigaciones Científicas (ES)
Venue
Physical Review Letters
Published
2007-11-20
Volume
99
Issue
21
Pages
216802-216802
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2113467957
Cited by
2,033
References
14
Citations by year
2026: 54 · 2025: 60 · 2024: 62 · 2023: 68 · 2022: 85 · 2021: 101 · 2020: 134 · 2019: 102 · 2018: 95 · 2017: 121 · 2016: 134 · 2015: 130 · 2014: 142 · 2013: 146 · 2012: 145
FWCI
55.56
Type
journal article
Language
en
Open access
Locations
  • Physical Review Letters (publishedVersion)
  • PubMed (publishedVersion)
  • Research Explorer (The University of Manchester) (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • DIGITAL.CSIC (Spanish National Research Council (CSIC)) (submittedVersion, other-oa)
  • arXiv (Cornell University)
  • Bulletin of the American Physical Society
Topics
  • Physical Sciences › Materials Science › Materials Chemistry › Graphene research and applications
  • Physical Sciences › Materials Science › Materials Chemistry › 2D Materials and Applications
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Quantum and electron transport phenomena
Keywords
bilayer graphene, electric field effects, band gap tuning, gate bias, Shubnikov-de Haas effect, cyclotron mass, tight-binding model, quantum Hall effect, electron density

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

A language model drew the claims from the paper on 2026-10-11, under version 3 of the claim definition (model deepseek-v4.1-flash, prompt extract-v3).

A second model labelled each claim on 2026-10-11 (model jev-1.13-20260917, definition revision gold-guideline-v0.2).

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

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