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Integration of macromolecular diffraction data

Leslie, A. G. W.·2006·International Tables for Crystallography

Abstract

In this chapter the integration of macromolecular diffraction data from two-dimensional area detectors is described. Data integration refers to the process of obtaining estimates of diffracted intensities (and their standard deviations) from the raw images recorded by an X-ray detector. When collecting data, a decision has to be taken about the magnitude of the angular rotation of the crystal during the recording of each image: the rotation per image can be comparable to, or greater than, the angular reflection range of a typical reflection (coarse ϕ slicing), or it can be much less than the reflection width (fine ϕ slicing). The latter approach allows the use of three-dimensional profile fitting and, providing that the detector is relatively noise-free, improves the quality of the resulting data by minimizing the contribution of the X-ray background to the total measured intensity. Methods of integration are described and integration by simple summation and by profile fitting is discussed. Keywords: background; data integration; detector overloads; errors; integration of diffraction data; outliers; overloads; partially recorded reflections; profile fitting; standard profiles; summation integration

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Authors
Leslie, A. G. W.
Venue
International Tables for Crystallography
Published
2006-10-01
Pages
212-217
OpenAlex
W2913186510
Cited by
696
References
0
FWCI
199.49
Type
book chapter
Language
en
Open access
closed

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