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GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution

Björck, Matts, Andersson, Gabriella·2007·Journal of Applied Crystallography

Abstract

GenX is a versatile program using the differential evolution algorithm for fitting X-ray and neutron reflectivity data. It utilizes the Parratt recursion formula for simulating specular reflectivity. The program is easily extensible, allowing users to incorporate their own models into the program. This can be useful for fitting data from other scattering experiments, or for any other minimization problem which has a large number of input parameters and/or contains many local minima, where the differential evolution algorithm is suitable. In addition,GenX manages to fit an arbitrary number of data sets simultaneously. The program is released under the GNU General Public License.

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Metadata

Authors
Björck, M., & Andersson, G.
Venue
Journal of Applied Crystallography
Published
2007-11-10
Volume
40
Issue
6
Pages
1174-1178
ISSN
0021-8898 (ISSN-L)
OpenAlex
W2012695793
Cited by
934
References
4
FWCI
5.12
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution. https://app.cochat.ai/papers/10.1107/s0021889807045086
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Björck, M., & Andersson, G. (2007). GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution. Journal of Applied Crystallography. https://doi.org/10.1107/s0021889807045086

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