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IMD—Software for modeling the optical properties of multilayer films
Open accessAbstract
A computer program called IMD is described. IMD is used for modeling the optical properties (reflectance, transmittance, electric-field intensities, etc.) of multilayer films, i.e., films consisting of any number of layers of any thickness. IMD includes a full graphical user interface and affords modeling with up to eight simultaneous independent variables, as well as parameter estimation (including confidence interval generation) using nonlinear, least-squares curve fitting to user-supplied experimental optical data. The computation methods and user interface are described, and numerous examples are presented that illustrate some of IMD’s unique modeling, fitting, and visualization capabilities. © 1998 American Institute of Physics.
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Cites
An Algorithm for Least-Squares Estimation of Nonlinear Parameters
Marquardt, D. W. (1963) · Journal of the Society for Industrial and Applied Mathematics · doi:10.1137/0111030 · Cited by 30,728
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Laser-induced magnetization dynamics and reversal in ferrimagnetic alloys
Kirilyuk, A., Kimel, A. V., & Rasing, T. (2013) · Reports on Progress in Physics · doi:10.1088/0034-4885/76/2/026501 · Cited by 360
Self-consistent optical constants of SiO_2 and Ta_2O_5 films
Rodríguez-de Marcos, L. V., Larruquert, J. I., Méndez, J. A., & Aznárez, J. A. (2016) · Optical Materials Express · doi:10.1364/ome.6.003622 · Cited by 323
Role of Magnetic Circular Dichroism in All-Optical Magnetic Recording
Khorsand, A. R., Savoini, M., Kirilyuk, A., Kimel, A. V., Tsukamoto, A., Itoh, A., & Rasing, T. (2012) · Physical Review Letters · doi:10.1103/physrevlett.108.127205 · Cited by 321
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Metadata
- Authors
- Windt, D. L.
- Venue
- Computers in Physics
- Publisher
- AIP Publishing
- Published
- 1998-07-01
- Volume
- 12
- Issue
- 4
- Pages
- 360-370
- ISSN
- 0894-1866 (ISSN-L)
- OpenAlex
- W1967828814
- Cited by
- 947
- References
- 1
- FWCI
- 10.85
- Type
- journal article
- Language
- en
- Open access
- bronze
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