The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
Single-event effects in avionics
Abstract
The occurrence of single-event upset (SEU) in aircraft electronics has evolved from a series of interesting anecdotal incidents to accepted fact. A study completed in 1992 demonstrated that SEUs are real, that the measured in-flight rates correlate with the atmospheric neutron flux, and that the rates can be calculated using laboratory SEU data. Once avionics SEU was shown to be an actual effect, it had to be dealt with in avionics designs. The major concern is in random access memories (RAMs), both static (SRAMs) and dynamic (DRAMs), because these microelectronic devices contain the largest number of bits, but other parts, such as microprocessors, are also potentially susceptible to upset. In addition, other single-event effects (SEEs), specifically latch-up and burnout, can also be induced by atmospheric neutrons.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Effect of Cosmic Rays on Computer Memories
Ziegler, J. F., & Lanford, W. A. (1979) · Science · doi:10.1126/science.206.4420.776 · Cited by 409
Single event upset in avionics
Taber, A., & Normand, E. (1993) · IEEE Transactions on Nuclear Science · doi:10.1109/23.212327 · Cited by 217
Self-citationNeutron-induced single event upsets in static RAMS observed a 10 km flight attitude
Olsen, J., Becher, P. E., Fynbo, P. B., Raaby, P., & Schultz, J. (1993) · IEEE Transactions on Nuclear Science · doi:10.1109/23.212319 · Cited by 94
Proton Component of the Primary Cosmic Radiation
McDonald, F. B., & Webber, W. R. (1959) · Physical Review · doi:10.1103/physrev.115.194 · Cited by 89
Guidelines for predicting single-event upsets in neutron environments (RAM devices)
Letaw, J. R., & Normand, E. (1991) · IEEE Transactions on Nuclear Science · doi:10.1109/23.124138 · Cited by 75
Self-citationAltitude Variation of Cosmic-ray Neutrons
Nakamura, T., Uwamino, Y., Ohkubo, T., & Hara, A. (1987) · Health Physics · doi:10.1097/00004032-198711000-00008 · Cited by 64
Dyer, C. S., Sims, A. J., Farren, J., & Stephen, J. H. (1990) · IEEE Transactions on Nuclear Science · doi:10.1109/23.101211 · Cited by 36
Cited by
Radiation-induced soft errors in advanced semiconductor technologies
Baumann, R. C. (2005) · IEEE Transactions on Device and Materials Reliability · doi:10.1109/tdmr.2005.853449 · Cited by 1,549
Single event upset at ground level
Normand, E. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.556861 · Cited by 620
Self-citationSoft error rate mitigation techniques for modern microcircuits
Mavis, D. G., & Eaton, P. H. (2003) · 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) · doi:10.1109/relphy.2002.996639 · Cited by 369
Metadata
- Authors
- Normand, E.
- Venue
- IEEE Transactions on Nuclear Science
- Published
- 1996-04
- Volume
- 43
- Issue
- 2
- Pages
- 461-474
- ISSN
- 0018-9499 (ISSN-L)
- 1558-1578
- OpenAlex
- W2149394641
- Cited by
- 420
- References
- 7
- FWCI
- 7.77
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Single-event effects in avionics. https://app.cochat.ai/papers/10.1109/23.490893
- The paper
- Normand, E. (1996). Single-event effects in avionics. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/23.490893
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
