Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 217

The DOI matches its Crossref record.

Single event upset in avionics

Taber, A., Normand, E.·1993·IEEE Transactions on Nuclear Science

Abstract

Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction circuitry be considered for all avionics designs containing large amounts of semiconductor memory.>

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1109/23.212327

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 217

Metadata

Authors
Taber, A., & Normand, E.
Venue
IEEE Transactions on Nuclear Science
Published
1993-04
Volume
40
Issue
2
Pages
120-126
ISSN
  • 0018-9499 (ISSN-L)
  • 1558-1578
OpenAlex
W2119490044
Cited by
217
References
0
FWCI
4.94
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Single event upset in avionics. https://app.cochat.ai/papers/10.1109/23.212327
The paper
Taber, A., & Normand, E. (1993). Single event upset in avionics. IEEE Transactions on Nuclear Science. https://doi.org/10.1109/23.212327

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.