Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 326

The DOI matches its Crossref record; 21 of the 21 references it cites were found in a registry or an index.

Combinational test generation using satisfiability

Stephan, P., Brayton, R.K., Sangiovanni-Vincentelli, A.L.·1996·IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Abstract

We present a robust, efficient algorithm for combinational test generation using a reduction to satisfiability (SAT). The algorithm, Test Generation Using Satisfiability (TEGUS), solves a simplified test set characteristic equation using straightforward but powerful greedy heuristics, ordering the variables using depth-first search and selecting a variable from the next unsatisfied clause at each branching point. For difficult faults, the computation of global implications is iterated, which finds more implications than previous approaches and subsumes structural heuristics such as unique sensitization. Without random tests or fault simulation, TEGUS completes on every fault in the ISCAS networks, demonstrating its robustness, and is ten times faster for those networks which have been completed by previous algorithms. Our implementation of TEGUS can be used as a base line for comparing test generation algorithms; we present comparisons with 45 recently published algorithms. TEGUS combines the advantages of the elegant organization of SAT-based algorithms with the efficiency of structural algorithms.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1109/43.536723

Cites

21 of 21 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 21 references

Cited by

See all 326

Metadata

Authors
Stephan, P., Brayton, R. K., & Sangiovanni-Vincentelli, A. L.
Venue
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Published
1996
Volume
15
Issue
9
Pages
1167-1176
ISSN
0278-0070 (ISSN-L)
OpenAlex
W2135613306
Cited by
326
References
21
FWCI
17.10
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Combinational test generation using satisfiability. https://app.cochat.ai/papers/10.1109/43.536723
The paper
Stephan, P., Brayton, R. K., & Sangiovanni-Vincentelli, A. L. (1996). Combinational test generation using satisfiability. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. https://doi.org/10.1109/43.536723

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.