ESD: a pervasive reliability concern for IC technologies
Abstract
Several aspects of ESD are described from the point of view of the test, design, product, and reliability engineering. A review of the ESD phenomena along with the test methods, the appropriate on-chip protection techniques, and the impact of process technology advances from CMOS to BiCMOS on the ESD sensitivity of IC protection circuits are presented. The status of understanding in the field of ESD failure physics and the current approaches for modeling are discussed.>
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Vulnerability to electrostatic discharge from a charged human operator or during machine-based assembly is a critical consideration for neural amplifier ICs, especially in dry environments.
“Vulnerability to an electrostatic discharge (ESD) from a charged human operator or during machine-based assembly processes is another critical consideration [33, 115]. This is a particularly serious problem when the amplifier IC is used in dry environments, such as in the operating theater or in dry climates.”
From Implantable neurotechnologies: a review of integrated circuit neural amplifiers (2016) · cites this paper as [33]
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Implantable neurotechnologies: a review of integrated circuit neural amplifiers
Ng, K. A., Greenwald, E., Xu, Y. P., & Thakor, N. V. (2016) · Medical & Biological Engineering & Computing · doi:10.1007/s11517-015-1431-3 · Cited by 83 · see citing works
- Authors
- Duvvury, C., & Amerasekera, A.
- Affiliations
- Texas Instruments (United States) (US)
- Venue
- Proceedings of the IEEE
- Published
- 1993-05
- Volume
- 81
- Issue
- 5
- Pages
- 690-702
- ISSN
- 0018-9219 (ISSN-L)
- OpenAlex
- W2170466905
- Cited by
- 148
- References
- 25
- Citations by year
- 2026: 2 · 2025: 5 · 2023: 4 · 2022: 3 · 2021: 3 · 2019: 2 · 2017: 3 · 2016: 3 · 2014: 2 · 2013: 1 · 2012: 3
- FWCI
- 6.92
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Proceedings of the IEEE (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrostatic Discharge in Electronics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Integrated Circuits and Semiconductor Failure Analysis
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Keywords
- electrostatic discharge, integrated circuit reliability, ESD protection circuits, on-chip ESD protection, BiCMOS, CMOS process technology, ESD sensitivity
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