Cited by 73Silicon Carbide Semiconductor TechnologiesGaN-based semiconductor devices and materialsAdvanced Power Amplifier Design

Paralleling GaN E-HEMTs in 10kW–100kW systems

Lu, Juncheng Lucas, Chen, Di·2017·2017 IEEE Applied Power Electronics Conference and Exposition (APEC)

Abstract

Industry is adopting GaN HEMT in 10kW–100kW and higher power systems due to the ultra-fast switching capabilities of GaN. Paralleling GaN HEMT transistors is an appealing idea to further increase the power capability and reduce conduction losses of systems. The characteristics of E-mode GaN HEMT, such as positive temperature coefficient of RDS(ON) and a temperature independent threshold voltage, are very suitable for paralleling devices. However, the main challenge for parallel operation is thought to be the diverse parasitics of the power stage and gate driver circuits, which are very sensitive to the high di/dt and dv/dt during the switching process. In this paper, an analytic model for the switching process of paralleled GaN HEMT transistors is built to analyze the effects of parasitics and device characteristics on paralleling, and the design consideration for gate driver and layout is also presented. A half bridge power stage consisting of four high-side and four low-side 60 A / 650 V GaN HEMTs in parallel is designed to undertake 240 A / 400 V hard switching on and off. Double pulse testing results are presented to confirm GaN paralleling capability.

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Crossref · 10.1109/apec.2017.7931131

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9 of 9 references verified0 citation errors · 0 not checkable

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  • The cost of WBG devices is expected to further decrease, which will help broaden their use in cost-competitive applications such as the automotive industry.

    “Moreover, it is expected that the cost of WBG devices will further decrease, which will help broaden their use in cost-competitive applications such as the automotive industry.”
  • Although WBG devices currently have a higher cost, it is expected that the price will decrease as the production rises.

    “Although WBG devices currently have a higher cost, it is expected that the price will decrease as the production rises [143], [144].”

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Authors
Lu, J. L., & Chen, D.
Venue
2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Publisher
IEEE
Published
2017-03
Pages
3049-3056
ISSN
1048-2334 (ISSN-L)
OpenAlex
W2615126594
Cited by
73
References
9
Citations by year
2026: 3 · 2025: 7 · 2024: 9 · 2023: 3 · 2022: 4 · 2021: 15 · 2020: 8 · 2019: 12 · 2018: 10 · 2017: 2
FWCI
12.38
Type
conference paper
Language
en
Open access
closed
Locations
Conference proceedings/Conference proceedings - IEEE Applied Power Electronics Conference and Exposition (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › GaN-based semiconductor devices and materials
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Power Amplifier Design
Keywords
GaN HEMT, high-power electronics, parasitic effects, gate driver design, layout design, switching characteristics, hard switching, double-pulse testing, threshold voltage, conduction loss reduction

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