Cited by 31Domain Adaptation and Few-Shot LearningAdvanced Neural Network ApplicationsAdvanced Image and Video Retrieval Techniques

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Moving in the Right Direction: A Regularization for Deep Metric Learning

Mohan, Deen Dayal, Sankaran, Nishant, Fedorishin, Dennis, Setlur, Srirangaraj, Govindaraju, Venu·2020·2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)

Abstract

Deep metric learning leverages carefully designed sampling strategies and loss functions that aid in optimizing the generation of a discriminable embedding space. While effective sampling of pairs is critical for shaping the metric space during training, the relative interactions between pairs, and consequently the forces exerted on these pairs that direct their displacement in the embedding space can significantly impact the formation of well separated clusters. In this work, we identify a shortcoming of existing loss formulations which fail to consider more optimal directions of pair displacements as another criterion for optimization. We propose a novel direction regularization to explicitly account for the layout of sampled pairs and attempt to introduce orthogonality in the representations. The proposed regularization is easily integrated into existing loss functions providing considerable performance improvements. We experimentally validate our hypothesis on the Cars-196, CUB-200 and InShop datasets and outperform existing methods to yield state-of-the-art results on these datasets.

Overview

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Crossref · 10.1109/cvpr42600.2020.01460

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Citations

Cites

Research works printed but not linked: 23

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Metadata

Authors
Mohan, D. D., Sankaran, N., Fedorishin, D., Setlur, S., & Govindaraju, V.
Affiliations
University at Buffalo, State University of New York (US)
Venue
2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Publisher
IEEE
Published
2020-06
Pages
14579-14587
ISSN
1063-6919 (ISSN-L)
OpenAlex
W3035194537
Cited by
31
References
2
Citations by year
2025: 2 · 2024: 6 · 2023: 8 · 2022: 7 · 2021: 8
FWCI
2.19
Type
conference paper
Language
en
Open access
closed
Locations
IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings (publishedVersion)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Neural Network Applications
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Advanced Image and Video Retrieval Techniques
Keywords
deep metric learning, orthogonality, embedding space, loss functions, discriminative embedding, image retrieval

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