Evolving time-series based prediction models for quality criteria in a multi-stage production process
Abstract
We address the problem of predicting product quality for a latter stage in a production process already at an early stage. Thereby, the idea is to use time-series of process values, recorded during the on-line production process of the early stage and containing possible system dynamics and variations according to parameter settings or different environmental conditions, as input to predict the final quality criteria in the latter stage. We apply a non-linear partial least squares (PLS) variant for reducing the high input dimensionality of time-series batch-process problems, by combining PLS with generalized Takagi-Sugeno fuzzy systems, a new extended variant of classical TS fuzzy system (thus termed as PLS-Fuzzy). This combination opens the possibility to resolve non-linearities in the PLS score space without requiring extra pre-tuning parameters (as is the case in other non-linear PLS variants). The models are trained by an evolving and iterative vector quantization approach to find the optimal number of rules and their ideal positioning and shape, combined with a fuzzily weighted version of elastic net regu-larization for robust estimation of the consequent parameters. The adaptation algorithm of the models (termed as IPLS-GEFS) includes an on-the-fly evolving rule learning concept (GEFS), a forgetting strategy with dynamically varying forgetting factor in case of drifts (to increase flexibility by outweighing older samples) as well as a new variant for an incremental single-pass update of the latent variable space (IPLS). The latter can be seen as a new variant for incremental dimension reduction and subspace update and is necessary when the covariance characteristics between input and output changes. Results on a real-world data set from microfluidic chip production show a comparable performance of PLS-Fuzzy with random forests, extreme learning machines and deep learning with MLP neural networks, achieving low prediction errors (below 10%) with low model complexity. Updating the models with new on-line data — only achievable with our method, as the others are batch off-line methods (with mostly slow re-training phases) — decreased the model errors, at most when including incremental latent variable space update.
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Partially corrupted data from field devices affects real-time process control and time series analysis used for equipment reliability analysis, predictive maintenance, process optimization, condition monitoring, and quality control.
“If there is even partially corrupted data coming from field devices, it affects not only real-time process control, but also time series analysis applied in various algorithms used for equipment reliability analysis i.e. predictive maintenance [44], [45], process optimization, condition monitoring [46], quality control [47], [48] and similar.”
From SCADA Systems With Focus on Continuous Manufacturing and Steel Industry: A Survey on Architectures, Standards, Challenges and Industry 5.0 (2022) · cites this paper as [46]
Another approach to corrupted data from field devices is development of ML algorithms detecting and describing patterns that lead to abrupt changes in behavior of sensor signals in specific operating scenarios.
“Another approach to corrupted data coming from field devices is the development of ML algorithms detecting and describing the patterns that lead to abrupt changes in the behavior of sensor signals in specific operating scenarios [46].”
From SCADA Systems With Focus on Continuous Manufacturing and Steel Industry: A Survey on Architectures, Standards, Challenges and Industry 5.0 (2022) · cites this paper as [46]
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“maintenance [43], [44], process optimization, condition monitoring [45], quality control [46], [47] and similar.”
Background
- Authors
- Lughofer, E., Pollak, R., Zavoianu, A.-C., Meyer-Heye, P., Zorrer, H., Eitzinger, C., Lehner, J., Radauer, T., & Pratama, M.
- Affiliations
- Johannes Kepler University of Linz (AT)
- PROFACTOR GmbH (Austria) (AT)
- Nanyang Technological University (SG)
- Venue
- 2018 IEEE Conference on Evolving and Adaptive Intelligent Systems (EAIS)
- Publisher
- IEEE
- Published
- 2018-05
- Volume
- 171
- Pages
- 1-10
- OpenAlex
- W2810385025
- Cited by
- 4
- References
- 39
- Citations by year
- 2022: 2 · 2020: 1 · 2019: 1
- FWCI
- 0.75
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE Conference on Evolving and Adaptive Intelligent Systems (EAIS) (publishedVersion)
- Funders
- Österreichische Forschungsgemeinschaft
- Topics
- Physical Sciences › Engineering › Control and Systems Engineering › Fault Detection and Control Systems
- Physical Sciences › Chemistry › Analytical Chemistry › Spectroscopy and Chemometric Analyses
- Physical Sciences › Computer Science › Artificial Intelligence › Fuzzy Logic and Control Systems
- Keywords
- product quality prediction, multi-stage production processes, online model adaptation, batch processes
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