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Overcoming the challenges of crossbar resistive memory architectures
Abstract
The scalability of DRAM faces challenges from increasing power consumption and the difficulty of building high aspect ratio capacitors. Consequently, emerging memory technologies including Phase Change Memory (PCM), Spin-Transfer Torque RAM (STT-RAM), and Resistive RAM (ReRAM) are being actively pursued as replacements for DRAM memory. Among these candidates, ReRAM has superior characteristics such as high density, low write energy, and high endurance, making it a very attractive cost-efficient alternative to DRAM. In this paper, we present a comprehensive study of ReRAM-based memory systems. ReRAM's high density comes from its unique crossbar architecture where some peripheral circuits are laid below multiple layers of ReRAM cells. A crossbar architecture introduces special constraints on operating voltages, write latency, and array size. The access latency of a crossbar is a function of the data patterns involved in a write operation. These combined with ReRAM's exponential relationship between its write voltage and switching latency provide opportunities for architectural optimizations. This paper makes several key contributions. First, we study the crossbar architecture and describe trade-offs involving voltage drop, write latency, and data pattern. We then analyze microarchitectural enhancements such as double-sided ground biasing and multiphase reset operations to improve write performance. At the architecture level, a simple compression based data encoding scheme is pr…
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Lee, H. D., Kim, S. G., Cho, K., Hwang, H., Choi, H., Lee, J., Lee, S. H., Lee, H. J., Suh, J., Chung, S.-O., et al. (2012) · 2012 Symposium on VLSI Technology (VLSIT) · doi:10.1109/vlsit.2012.6242506 · Cited by 68
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ISAAC: A Convolutional Neural Network Accelerator with In-Situ Analog Arithmetic in Crossbars
Shafiee, A., Nag, A., Muralimanohar, N., Balasubramonian, R., Strachan, J. P., Hu, M., Williams, R. S., & Srikumar, V. (2016) · 2016 ACM/IEEE 43rd Annual International Symposium on Computer Architecture (ISCA) · doi:10.1109/isca.2016.12 · Cited by 775
Self-citationGül, F. (2019) · Results in Physics · doi:10.1016/j.rinp.2018.12.092 · Cited by 127
An Energy-Efficient Digital ReRAM-Crossbar-Based CNN With Bitwise Parallelism
Ni, L., Liu, Z., Yu, H., & Joshi, R. V. (2017) · IEEE Journal on Exploratory Solid-State Computational Devices and Circuits · doi:10.1109/jxcdc.2017.2697910 · Cited by 74
An Instruction Set Architecture for Machine Learning
Chen, Y., Lan, H., Du, Z., Liu, S., Tao, J., Han, D., Luo, T., Guo, Q., Li, L., Xie, Y., et al. (2018) · ACM Transactions on Computer Systems · doi:10.1145/3331469 · Cited by 14
Self-citation
Metadata
- Authors
- Xu, C., Niu, D., Muralimanohar, N., Balasubramonian, R., Zhang, T., Yu, S., & Xie, Y.
- Affiliations
- Pennsylvania State University (US)
- Hewlett-Packard (United States) (US)
- Arizona State University (US)
- Venue
- 2015 IEEE 21st International Symposium on High Performance Computer Architecture (HPCA)
- Publisher
- IEEE
- Published
- 2015-02
- Pages
- 476-488
- ISSN
- 1530-0897 (ISSN-L)
- OpenAlex
- W2013028205
- Cited by
- 340
- References
- 1
- Citations by year
- 2026: 12 · 2025: 14 · 2024: 9 · 2023: 31 · 2022: 23 · 2021: 39 · 2020: 34 · 2019: 57 · 2018: 52 · 2017: 27 · 2016: 33 · 2015: 9
- FWCI
- 49.96
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE International Symposium on High-Performance Computer Architecture (HPCA) (publishedVersion)
- Rare & Special e-Zone (The Hong Kong University of Science and Technology) (submittedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Memory and Neural Computing
- Physical Sciences › Computer Science › Hardware and Architecture › Parallel Computing and Optimization Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Keywords
- resistive random access memory, crossbar architecture, memory architecture, write latency, voltage drop, data encoding, DRAM replacement, main memory, phase-change memory, STT-MRAM
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