Cited by 46Industrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesImage Retrieval and Classification Techniques

A fast method of steel surface defect detection using decision trees applied to LBP based features

Aghdam, Sina Rezaei, Amid, Ehsan, Imani, Mohammad Faghih·2012·2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA)

Abstract

Surface defect detection plays a significant role in quality enhancement in steel manufacturing. Support Vector Machines and neural networks are the most popular classifiers in this application. Decision trees are also known as other classifiers for steel defect detection yielding a fast but moderate performance. In this paper, we introduce a more accurate classification method by using decision trees and applying Principal Component Analysis (PCA) and Bootstrap Aggregating (Bagging) on features being extracted by a local binary pattern based operator. This methodology yields an enhanced accuracy and reinstates decision trees as fast and accurate classifiers for two-class classification of steel surface defects. In order to have a complete classification in a real-time automatic surface inspection, a multiclass Support Vector Machine should be cascaded to the decision tree classifier. The proposed classification system is considerably faster than the traditional schemes.

Integrity signals

Registry

Crossref · 10.1109/iciea.2012.6360951

Cites

11 of 11 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Aghdam, S. R., Amid, E., & Imani, M. F.
Affiliations
Amirkabir University of Technology (IR)
Venue
2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA)
Publisher
IEEE
Published
2012-07
Pages
1447-1452
OpenAlex
W1991589289
Cited by
46
References
11
Citations by year
2026: 1 · 2025: 8 · 2024: 7 · 2023: 4 · 2022: 8 · 2021: 5 · 2020: 5 · 2019: 4 · 2018: 2 · 2017: 1 · 2016: 1
FWCI
0.00
Type
conference paper
Language
en
Open access
closed
Locations
IEEE Conference on Industrial Electronics and Applications (ICIEA) (publishedVersion)
Topics
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Engineering › Mechanical Engineering › Non-Destructive Testing Techniques
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Image Retrieval and Classification Techniques
Keywords
steel surface defect detection, decision tree, local binary pattern, feature extraction, principal component analysis, bagging, binary classification, multi-class support vector machine

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review