The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction
Abstract
The soft error rate (SER) of advanced CMOS devices is higher than all other reliability mechanisms combined. Memories can be protected with error correction circuitry but SER in logic may limit future product reliability. Memory and logic scaling trends are discussed along with a method for determining logic SER.
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Citations
Cites
Alpha-particle-induced soft errors in dynamic memories
May, T. C., & Woods, M. H. (1979) · IEEE Transactions on Electron Devices · doi:10.1109/t-ed.1979.19370 · Cited by 864
Single event upset at ground level
Normand, E. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.556861 · Cited by 620
The effect of sea level cosmic rays on electronic devices
Ziegler, J. F., & Lanford, W. A. (1981) · Journal of Applied Physics · doi:10.1063/1.329243 · Cited by 141
Single-event effects in SOI technologies and devices
Musseau, O. (1996) · IEEE Transactions on Nuclear Science · doi:10.1109/23.490904 · Cited by 124
A digital CMOS design technique for SEU hardening
Baze, M. P., Buchner, S. P., & McMorrow, D. (2000) · IEEE Transactions on Nuclear Science · doi:10.1109/23.903815 · Cited by 122
Boron compounds as a dominant source of alpha particles in semiconductor devices
Baumann, R., Hossain, T. Z., Murata, S., et al. (1995) · IEEE International Reliability Physics Symposium proceedings · doi:10.1109/relphy.1995.513695 · Cited by 110
Self-citationNeutron-induced 10B fission as a major source of soft errors in high density SRAMs
Baumann, R., & Smith, E. B. (2001) · Microelectronics Reliability · doi:10.1016/s0026-2714(00)00218-3 · Cited by 74
Self-citation
Cited by
Radiation-induced soft errors in advanced semiconductor technologies
Baumann, R. C. (2005) · IEEE Transactions on Device and Materials Reliability · doi:10.1109/tdmr.2005.853449 · Cited by 1,549
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Metadata
- Authors
- Baumann, R.
- Venue
- Digest. International Electron Devices Meeting,
- Publisher
- IEEE
- Published
- 2003-06-26
- Pages
- 329-332
- OpenAlex
- W1564617507
- Cited by
- 318
- References
- 7
- FWCI
- 35.95
- Type
- conference paper
- Language
- en
- Open access
- closed
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- Baumann, R. (2003). The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction. Digest. International Electron Devices Meeting,. https://doi.org/10.1109/iedm.2002.1175845
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
