Cited by 38Electronic Packaging and Soldering TechnologiesSilicon Carbide Semiconductor TechnologiesHeat Transfer and Optimization

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Direct liquid cooling module with high reliability solder joining technology for automotive applications

Morozumi, Akira, Hokazono, Hiroaki, Nishimura, Yoshitaka, Ikeda, Yoshinari, Nabetani, Yoichi, Takahashi, Yoshikazu·2013·2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

Abstract

We developed the direct-liquid-cooling IGBT module which enabled downsizing of a power control unit for HEV system and high reliability simultaneously. This module eliminates thermal grease by unifying a ceramic substrate and a heat sink. It contributes this module realized the reduction of thermal resistance 30 % compared to the conventional indirect liquid cooling type. High thermal conductive Si3N4ceramics for the substrate and lightweight aluminum heat sink that are suitable for automotive use demand are applied. The technological challenge of this module is to overcome the decrease of the reliability of the joint by large CTE mismatch between substrate and heat sink. We developed the Sn-Sb based solder material which can attain high reliability for automotive use with large CTE mismatch components. And IGBT module with this new solder is applied to HEV.

Overview

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Crossref · 10.1109/ispsd.2013.6694408

Cites

2 of 2 references verified0 citation errors · 0 not checkable

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Citations

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Research works printed but not linked: 2

  1. uhlemann, 2012, A new base plate concept on the basis of aluminum-copper clad material, ISBN 978-3-8007-3431-3 "Proceedings PCIM Europe 2012 Conference, 680
  2. sasaki, 2010, Small size, low thermal resistance and high reliability packaging technologies of igbt module for wind power applications, ISBN 978-3-8007-3229-6 "Proceedings PCIM Europe 2010 Conference, 267

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Metadata

Authors
Morozumi, A., Hokazono, H., Nishimura, Y., Ikeda, Y., Nabetani, Y., & Takahashi, Y.
Affiliations
  • Fuji Electric (Japan) (JP)
  • University of Yamanashi (JP)
Venue
2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD)
Publisher
IEEE
Published
2013-05
Pages
109-112
ISSN
1063-6854 (ISSN-L)
OpenAlex
W2144906639
Cited by
38
References
2
Citations by year
2026: 4 · 2025: 4 · 2024: 3 · 2022: 8 · 2021: 1 · 2019: 1 · 2018: 1 · 2017: 2 · 2016: 5 · 2015: 2 · 2014: 5 · 2013: 2
FWCI
5.68
Type
conference paper
Language
en
Open access
closed
Locations
IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electronic Packaging and Soldering Technologies
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Silicon Carbide Semiconductor Technologies
  • Physical Sciences › Engineering › Mechanical Engineering › Heat Transfer and Optimization
Keywords
direct liquid cooling, IGBT modules, ceramic substrates, silicon nitride ceramics, aluminum heat sink, thermal resistance, thermal expansion mismatch, joint reliability, automotive electronics

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