The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.
Nanoscale Thermal Transport and Microrefrigerators on a Chip
Abstract
In this paper we review recent advances in nanoscale thermal and thermoelectric transport with an emphasis on the impact on integrated circuit (IC) thermal management. We will first review thermal conductivity of low-dimensional solids. Experimental results have shown that phonon surface and interface scattering can lower thermal conductivity of silicon thin films and nanowires in the sub-100-nm range by a factor of two to five. Carbon nanotubes are promising candidates as thermal vias and thermal interface materials due to their inherently high thermal conductivities of thousands of W/mK and high mechanical strength. We then concentrate on the fundamental interaction between heat and electricity, i.e., thermoelectric effects, and how nanostructures are used to modify this interaction. We will review recent experimental and theoretical results on superlattice and quantum dot thermoelectrics as well as solid-state thermionic thin-film devices with embedded metallic nanoparticles. Heat and current spreading in the three-dimensional electrode configuration, allow removal of high-power hot spots in IC chips. Several III-V and silicon heterostructure integrated thermionic (HIT) microcoolers have been fabricated and characterized. They have achieved cooling up to 7 degC at 100 degC ambient temperature with devices on the order of 50 mum in diameter. The cooling power density was also characterized using integrated thin-film heaters; values ranging from 100 to 680 W/cm2were measured. Response time on the order of 20-40 ms has been demonstrated. Calculations show that with an improvement in material properties, hot spots tens of micrometers in diameter with heat fluxes in excess of 1000 W/cm2could be cooled down by 20 degC-30 degC. Finally we will review some of the more exotic techniques such as thermotunneling and analyze their potential application to chip cooling
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Citations
Cites
Thermal Transport Measurements of Individual Multiwalled Nanotubes
Kim, P., Shi, L., Majumdar, A., & McEuen, P. L. (2001) · Physical Review Letters · doi:10.1103/physrevlett.87.215502 · Cited by 3,378 · cited 2×
“Furthermore, at an interface between two solids, depending on the coupling between atoms, there could be an extra thermal boundary resistance (this is also called Kapitza resistance which was introduced in the 1950s for liquid helium).”
BackgroundThermal conductivity measurement from 30 to 750 K: the 3ω method
Cahill, D. G. (1990) · Review of Scientific Instruments · doi:10.1063/1.1141498 · Cited by 1,928
Thermal Interface Materials: Historical Perspective, Status, and Future Directions
Prasher, R. (2006) · Proceedings of the IEEE · doi:10.1109/jproc.2006.879796 · Cited by 927
Thermal conduction in ultrathin pure and doped single-crystal silicon layers at high temperatures
Liu, W., & Asheghi, M. (2005) · Journal of Applied Physics · doi:10.1063/1.2149497 · Cited by 166
Characterization of nanostructured metal films by picosecond acoustics and interferometry
O’Hara, K. E., Hu, X., & Cahill, D. G. (2001) · Journal of Applied Physics · doi:10.1063/1.1406543 · Cited by 95
Cited by
Jaque, D., & Vetrone, F. (2012) · Nanoscale · doi:10.1039/c2nr30764b · Cited by 1,507
Colloquium: Heat flow and thermoelectricity in atomic and molecular junctions
Dubi, Y., & Di Ventra, M. (2011) · Reviews of Modern Physics · doi:10.1103/revmodphys.83.131 · Cited by 818
Attojoule Optoelectronics for Low-Energy Information Processing and Communications
Miller, D. A. B. (2017) · Journal of Lightwave Technology · doi:10.1109/jlt.2017.2647779 · Cited by 708
Nanoengineered materials for liquid–vapour phase-change heat transfer
Cho, H. J., Preston, D. J., Zhu, Y., & Wang, E. N. (2016) · Nature Reviews Materials · doi:10.1038/natrevmats.2016.92 · Cited by 657
“Nanoparticle-in-Alloy” Approach to Efficient Thermoelectrics: Silicides in SiGe
Mingo, N., Hauser, D., Kobayashi, N. P., Plissonnier, M., & Shakouri, A. (2009) · Nano Letters · doi:10.1021/nl8031982 · Cited by 405
Self-citation
Metadata
- Authors
- Shakouri, A.
- Venue
- Proceedings of the IEEE
- Published
- 2006-08
- Volume
- 94
- Issue
- 8
- Pages
- 1613-1638
- ISSN
- 0018-9219 (ISSN-L)
- 1558-2256
- OpenAlex
- W2082252970
- Cited by
- 221
- References
- 5
- FWCI
- 6.94
- Type
- journal article
- Language
- en
- Open access
- closed
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