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Cited by 459

The DOI matches its Crossref record; 59 of the 59 references it cites were found in a registry or an index.

Fully Deep Blind Image Quality Predictor

Kim, Jongyoo, Lee, Sanghoon·2017·IEEE Journal of Selected Topics in Signal Processing

Abstract

In general, owing to the benefits obtained from original information, full-reference image quality assessment (FR-IQA) achieves relatively higher prediction accuracy than no-reference image quality assessment (NR-IQA). By fully utilizing reference images, conventional FR-IQA methods have been investigated to produce objective scores that are close to subjective scores. In contrast, NR-IQA does not consider reference images; thus, its performance is inferior to that of FR-IQA. To alleviate this accuracy discrepancy between FR-IQA and NR-IQA methods, we propose a blind image evaluator based on a convolutional neural network (BIECON). To imitate FR-IQA behavior, we adopt the strong representation power of a deep convolutional neural network to generate a local quality map, similar to FR-IQA. To obtain the best results from the deep neural network, replacing hand-crafted features with automatically learned features is necessary. To apply the deep model to the NR-IQA framework, three critical problems must be resolved: 1) lack of training data; 2) absence of local ground truth targets; and 3) different purposes of feature learning. BIECON follows the FR-IQA behavior using the local quality maps as intermediate targets for conventional neural networks, which leads to NR-IQA prediction accuracy that is comparable with that of state-of-the-art FR-IQA methods.

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Metadata

Authors
Kim, J., & Lee, S.
Venue
IEEE Journal of Selected Topics in Signal Processing
Published
2017-02
Volume
11
Issue
1
Pages
206-220
ISSN
  • 1932-4553 (ISSN-L)
  • 1941-0484
OpenAlex
W2566149141
Cited by
459
References
59
FWCI
26.47
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Fully Deep Blind Image Quality Predictor. https://app.cochat.ai/papers/10.1109/jstsp.2016.2639328
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Kim, J., & Lee, S. (2017). Fully Deep Blind Image Quality Predictor. IEEE Journal of Selected Topics in Signal Processing. https://doi.org/10.1109/jstsp.2016.2639328

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