Cited by 533D IC and TSV technologiesParallel Computing and Optimization TechniquesInterconnection Networks and Systems

The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.

3D DRAM Design and Application to 3D Multicore Systems

Sun, Hongbin, Liu, Jibang, Anigundi, Rakesh S., Zheng, Nanning, Lu, Jian-Qiang, Rose, Kenneth, Zhang, Tong·2009·IEEE Design & Test of Computers

Abstract

Editor's note:From a system architecture perspective, 3D technology can satisfy the high memory bandwidth demands that future multicore/manycore architectures require. This article presents a 3D DRAM architecture design and the potential for using 3D DRAM stacking for both L2 cache and main memory in 3D multicore architecture.—Yuan Xie, Pennsylvania State University

Overview

Integrity signals

Registry

Crossref · 10.1109/mdt.2009.105

Cites

11 of 11 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • EUVL is used to produce DRAM devices.

    “EUVL is also used to produce dynamic random access memory (DRAM) devices 101 .”

    From Extreme ultraviolet lithography (2024) · cites this paper as [101]

Citations

Cites

Flagged first, then by citations

Research works printed but not linked: 2

  1. 2008, 3D Stacked DRAM/Bi-STAR Overview
  2. 0, CACTI An Integrated Cache and Memory Access Time Cycle Time Area Leakage and Dynamic Power Model

Cited by

Sorted by citations

Metadata

Authors
Sun, H., Liu, J., Anigundi, R. S., Zheng, N., Lu, J.-Q., Rose, K., & Zhang, T.
Affiliations
  • Xi'an Jiaotong University (CN)
  • Rensselaer Polytechnic Institute (US)
Venue
IEEE Design & Test of Computers
Published
2009-09
Volume
26
Issue
5
Pages
36-47
ISSN
0740-7475 (ISSN-L)
OpenAlex
W2077105843
Cited by
53
References
11
Citations by year
2026: 2 · 2025: 2 · 2024: 2 · 2023: 1 · 2022: 2 · 2018: 1 · 2017: 4 · 2016: 1 · 2015: 5 · 2014: 5 · 2013: 6 · 2012: 9
FWCI
5.82
Type
journal article
Language
en
Open access
closed
Locations
IEEE Design & Test of Computers (publishedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › 3D IC and TSV technologies
  • Physical Sciences › Computer Science › Hardware and Architecture › Parallel Computing and Optimization Techniques
  • Physical Sciences › Computer Science › Computer Networks and Communications › Interconnection Networks and Systems
Keywords
3D DRAM, memory bandwidth, L2 cache, main memory, 3D integrated circuits

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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