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Cited by 421

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The Hunt For The Kill Switch

Adee, Sally·2008·IEEE Spectrum

Abstract

This paper has described the issues on electronic circuits which are made for military equipments.The DoD of U.S. recently launched its most ambitious program yet to verify the integrity of the electronics that will underpin future additions to its arsenal. The Defense Advanced Research Projects Agency (DARPA), the Pentagon's R&D wing, and released details about a three-year initiative it calls the Trust in Integrated Circuits program. The findings from the program could give the military and defense contractors who make sensitive microelectronics like the weapons systems for the F-35 a guaranteed method of determining whether their chips have been compromised. The Trust program started its prequalifying rounds by sending to three contractors four identical versions of a chip that contained unspecified malicious circuitry, though U.S. military consumes only 1% of world's integrated circuits.

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Metadata

Authors
Adee, S.
Venue
IEEE Spectrum
Published
2008-05
Volume
45
Issue
5
Pages
34-39
ISSN
0018-9235 (ISSN-L)
OpenAlex
W1994870682
Cited by
421
References
0
FWCI
42.09
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: The Hunt For The Kill Switch. https://app.cochat.ai/papers/10.1109/mspec.2008.4505310
The paper
Adee, S. (2008). The Hunt For The Kill Switch. IEEE Spectrum. https://doi.org/10.1109/mspec.2008.4505310

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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.