Cited by 5Neuroscience and Neural EngineeringAnalog and Mixed-Signal Circuit DesignElectrical and Bioimpedance Tomography

A diagnostic circuit for crosstalk detection in microelectrode arrays

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McNamara, Morgan, Ersoz, Alpaslan, Han, Martin·2021·2021 10th International IEEE/EMBS Conference on Neural Engineering (NER)

Abstract

Current leakage between channels in microelectrode arrays is a sign of device failure and can lead to shorting of neural signals. The purpose of this project is to detect crosstalk between 32 channels of electrodes. We designed an embedded crosstalk detection system that can stimulate each electrode individually with a constant-current pulse and record voltage transients of the stimulated and adjacent electrodes to generate a matrix of crosstalk values. Charge injection in a phosphate buffered saline solution was used to check the condition of each electrode. A semi-wet condition was then used to determine the percent crosstalk between the channels. The analysis showed that there was minimal crosstalk between the electrodes, except for a known physical defect on the probe. The measurement technique enabled by the electronics circuit has the potential to be used in functional testing and screening of implantable devices.

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Crossref · 10.1109/ner49283.2021.9441164

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  • Cross-talk can be particularly problematic in the compact environments of neural implants, potentially distorting the signal and leading to data loss or errors.

    “This internal interference can be particularly problematic in the compact environments of neural implants potentially distorting the signal and leading to data loss or errors (McNamara et al., 2021).”

    From Comparative analysis of energy transfer mechanisms for neural implants (2024) · cites this paper as McNamara et al., 2021

    The Abstract says current leakage between channels can short neural signals, and the Introduction describes crosstalk as undesired coupling in microelectrode arrays used for neuroprosthetics. The paper does not attribute heightened risk to the compact environment of neural implants or specifically describe data loss or errors; its reference to a compact design concerns the diagnostic circuit. (LLM, conf=0.86)

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Authors
McNamara, M., Ersoz, A., & Han, M.
Affiliations
University of Connecticut (US)
Venue
2021 10th International IEEE/EMBS Conference on Neural Engineering (NER)
Publisher
IEEE
Published
2021-05-04
Volume
2021
Pages
544-547
ISSN
1948-3554 (ISSN-L)
OpenAlex
W3167778830
Cited by
5
References
17
Citations by year
2024: 2 · 2023: 2 · 2022: 1
FWCI
5.03
Type
conference paper
Language
en
Open access
Locations
  • International IEEE/EMBS Conference on Neural Engineering (publishedVersion)
  • PubMed (publishedVersion)
  • PubMed Central (acceptedVersion)
Funders
NIH (R01DC014044,R24NS086603)
Topics
  • Life Sciences › Neuroscience › Cellular and Molecular Neuroscience › Neuroscience and Neural Engineering
  • Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrical and Bioimpedance Tomography
Keywords
microelectrode arrays, leakage current, voltage transients, charge injection, phosphate buffered saline, functional testing

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