Cited by 140Neuroscience and Neural EngineeringElectronic Packaging and Soldering TechnologiesWireless Body Area Networks

Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices

Open access
Vanhoestenberghe, A, Donaldson, N·2013·Journal of Neural Engineering

Abstract

Corrosion is a prime concern for active implantable devices. In this paper we review the principles underlying the concepts of hermetic packages and encapsulation, used to protect implanted electronics, some of which remain widely overlooked. We discuss how technological advances have created a need to update the way we evaluate the suitability of both protection methods. We demonstrate how lifetime predictability is lost for very small hermetic packages and introduce a single parameter to compare different packages, with an equation to calculate the minimum sensitivity required from a test method to guarantee a given lifetime. In the second part of this paper, we review the literature on the corrosion of encapsulated integrated circuits (ICs) and, following a new analysis of published data, we propose an equation for the pre-corrosion lifetime of implanted ICs, and discuss the influence of the temperature, relative humidity, encapsulation and field-strength. As any new protection will be tested under accelerated conditions, we demonstrate the sensitivity of acceleration factors to some inaccurately known parameters. These results are relevant for any application of electronics working in a moist environment. Our comparison of encapsulation and hermetic packages suggests that both concepts may be suitable for future implants.

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1088/1741-2560/10/3/031002

Cites

56 of 56 references verified0 citation errors · 0 not checkable

Statistics

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Implant packaging methods to provide biocompatibility and corrosion protection through hermetic packages and coatings and non-hermetic encapsulants aim to offer device lifetimes of years to decades.

    “Implant packaging methods to provide a biocompatiblity and corrosion protection through hermetic packages and coatings and non-hermetic encapsulants aim to offer device lifetimes of years to decades [213], [214], [215].”
  • Current density through the passivation layer of implantable ASICs affects their lifetime.

    “Furthermore, implantable ASICs, should be designed such that the current density through their passivation layer is limited, as this has been shown to affect the lifetime (Vanhoestenberghe and Donaldson 2013).”
  • For hermetic packages with volumes less than 1mm3, long-life predictability is lost.

    “Furthermore, rigid packages are likely to damage the fragile targeted nerves, while it has been shown that for hermetic packages with volumes less than 1mm3, long-life predictability is lost (Vanhoestenberghe and Donaldson 2013).”

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Cites

Flagged first, then by citations

1 of the 57 references couldn’t be matched to a known paper.

Research works printed but not linked: 10

  1. Bayle F & Mettas A 2010 in 'Proceedings of the Reliability and Maintainability Symposium (RAMS), 2010' IEEE pp. 1-6.
  2. Christou A & Wilkins W 1977 in 'Proc. 15th Annual Reliability Physics Symposium' pp. 112-119.
  3. Cirmirakis D, Demosthenous A, Saeidi N, Vanhoestenberghe A & Donaldson N 2011 in 'Proc. IEEE Sensors' pp. 1511-1514.
  4. DerMarderosian A & Murphy C 1977 in 'Proc. 15th Annual Reliability Physics Symposium' pp. 92-100.
  5. Donaldson N, Vanhoestenberghe A, Saeidi N, Evans J, Liu X, Cirmirakis D, Demosthenous A & Schuettler M 2011 in 'Proc. of the Medical Bionics Conference' Melbourne.
  6. Koelmans H 1974 in 'Reliability Physics Symposium, 1974. 12th Annual' pp. 168 -171.
  7. Sbar N L & Kozakiewicz R P 1978 in 'Proc. 16th Annual Reliability Physics Symposium' pp. 161-178.
  8. Schuettler M, Schatz A, Ordonez J S & Stieglitz T 2011 in 'Proc. 33rd Annual International Conference of the IEEE EMBS' pp. 2296-2299.
  9. Sim S & Lawson R 1979 in '17th Annual Reliability Physics Symposium' IEEE pp. 103-112.
  10. Zrenner E, Wilke R, Bartz-Schmidt K U, Gekeler F, Besch D, Benav H, Bruckmann A, Porubska K, Kusnyerik A, Sachs H, Peters T, Wilhelm B, Greppmaier U, Harscher A, Kibbel S, Wrobel W & Stett A 2009 in 'Proc. 2nd International Conference on Biomedical Engineering and Informatics (BMEI)' pp. 1-4.

Cited by

Sorted by citations

Authors
Vanhoestenberghe, A., & Donaldson, N.
Affiliations
University College London (GB)
Venue
Journal of Neural Engineering
Published
2013-05-20
Volume
10
Issue
3
Pages
031002
ISSN
  • 1741-2552 (ISSN-L)
  • 1741-2560
OpenAlex
W1987796903
Cited by
140
References
57
Citations by year
2026: 6 · 2025: 9 · 2024: 11 · 2023: 10 · 2022: 6 · 2021: 11 · 2020: 18 · 2019: 19 · 2018: 12 · 2017: 7 · 2016: 12 · 2015: 7 · 2014: 7 · 2013: 4
FWCI
1.02
Type
journal article
Language
en
Open access
Locations
  • Journal of Neural Engineering (publishedVersion)
  • PubMed (publishedVersion)
  • UCL Discovery (University College London) (submittedVersion)
Funders
  • European Commission (258654)
  • Engineering and Physical Sciences Research Council (EP/F009593/1)
Topics
  • Life Sciences › Neuroscience › Cellular and Molecular Neuroscience › Neuroscience and Neural Engineering
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Electronic Packaging and Soldering Technologies
  • Physical Sciences › Engineering › Biomedical Engineering › Wireless Body Area Networks
Keywords
corrosion, silicon integrated circuits, implantable electronics, hermetic packaging, encapsulation, lifetime prediction, accelerated testing, acceleration factor, relative humidity, temperature effects, field strength, moisture protection
MeSH terms
Corrosion, Electronics, Medical, Materials Testing, Semiconductors, Silicon, Equipment Failure Analysis, Prostheses and Implants, Coated Materials, Biocompatible

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review