The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Temperature measurements of semiconductor devices - a review
Abstract
There are numerous methods for measuring the temperature of an operating semiconductor device. The methods can be broadly placed into three generic categories: electrical, optical, and physically contacting. The fundamentals underlying each of the categories are discussed, and a review of the variety of techniques within each category is given. Some of the advantages and disadvantages as well as the spatial, time, and temperature resolution are also provided.
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Citations
Cites
Physics of Semiconductor Devices
Sze, S. M., & Ng, K. K. (2006) · doi:10.1002/0470068329 · Cited by 14,627
Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures
Cahill, D. G., Goodson, K., & Majumdar, A. (2002) · Journal of Heat Transfer · doi:10.1115/1.1454111 · Cited by 611
Cited by
Avenas, Y., Dupont, L., & Khatir, Z. (2012) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2011.2178433 · Cited by 559
Sarua, A., Ji, H., Kuball, M., Uren, M. J., Martin, T., Hilton, K. P., & Balmer, R. S. (2006) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2006.882274 · Cited by 267
Overview of Real-Time Lifetime Prediction and Extension for SiC Power Converters
Ni, Z., Lyu, X., Yadav, O. P., Singh, B. N., Zheng, S., & Cao, D. (2020) · IEEE Transactions on Power Electronics · doi:10.1109/tpel.2019.2962503 · Cited by 261
Real-Time Measurement of Temperature Sensitive Electrical Parameters in SiC Power MOSFETs
Griffo, A., Wang, J., Colombage, K., & Kamel, T. (2018) · IEEE Transactions on Industrial Electronics · doi:10.1109/tie.2017.2739687 · Cited by 175
Power electronics - the key technology for renewable energy system integration
Blaabjerg, F., Yang, Y., Ma, K., & Wang, X. (2015) · 2015 International Conference on Renewable Energy Research and Applications (ICRERA) · doi:10.1109/icrera.2015.7418680 · Cited by 148
Metadata
- Authors
- Blackburn, D. L.
- Venue
- Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)
- Publisher
- IEEE
- Published
- 2004-05-06
- Pages
- 70-80
- OpenAlex
- W2109894155
- Cited by
- 319
- References
- 2
- FWCI
- 8.28
- Type
- conference paper
- Language
- en
- Open access
- closed
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- Blackburn, D. L. (2004). Temperature measurements of semiconductor devices - a review. Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545). https://doi.org/10.1109/stherm.2004.1291304
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Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
